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Habilitation à diriger des recherches

Methodologie de conception des protections des circuits intégrés contre les décharges électostatiques

Abstract : Electrostatic Discharge (ESD) stresses strongly impact on integrated circuits reliability. The research work led in LAAS-CNRS laboratory on this field is synthesized in this document. The following topics are detailed : - physical mechanisms study of device behavior during an ESD stress - design methodology for ESD protection devices - novelty ESD protections development The final part of this report presents an outlook which is closely tied to integrated circuits technology advance, ESD standard development and system level approach.
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Habilitation à diriger des recherches
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https://tel.archives-ouvertes.fr/tel-00265344
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Submitted on : Wednesday, March 19, 2008 - 9:02:17 AM
Last modification on : Friday, October 23, 2020 - 4:33:39 PM
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  • HAL Id : tel-00265344, version 1

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Nicolas Nolhier. Methodologie de conception des protections des circuits intégrés contre les décharges électostatiques. Micro et nanotechnologies/Microélectronique. Université Paul Sabatier - Toulouse III, 2005. ⟨tel-00265344⟩

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