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Technique d'auto test pour des convertisseurs de signal Sigma-Delta

Abstract : The test of analogue and mixed-signal circuits is becoming very costly, sometimes taking up to 50% of the total product cost. Built-In Self-Techniques (BIST) have the potential to reduce these costs, moving most of the test complexity to the design domain and making the circuit auto-testable. In this thesis, we present a new BIST technique for Sigma-Delta Analogue-to-Digital Converters (ADC). This approach exhibits both a very low area overhead and a short test time. Considering the continuous downscaling of digital circuits, we propose a strategy mainly digital, which is in-line with the philosophy of Sigma-Delta converters. As test signal, we generate on-chip a binary stimulus which encodes a very-high precision sinusoidal signal. The same binary stimulus is used for the response analysis, performed on-chip by means of a sine-wave fitting algorithm. The reuse of the resources already present in the circuit allow us to calculate the converter SINAD (SIgnal-to-Noise And Distortion ratio) in a very efficient way. As result of this work, a prototype has been designed and fabricated in a 0.13 µm CMOS technology from STMicroelectronics. The experimental results confirm the capacity of the BIST technique to measure the SINAD in a 16-bit audio Sigma Delta Converter.
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Contributor : Lucie Torella <>
Submitted on : Wednesday, July 18, 2007 - 3:16:05 PM
Last modification on : Friday, December 11, 2020 - 8:28:04 AM
Long-term archiving on: : Thursday, April 8, 2010 - 11:33:41 PM


  • HAL Id : tel-00163788, version 1




L. Rolindez. Technique d'auto test pour des convertisseurs de signal Sigma-Delta. Micro et nanotechnologies/Microélectronique. Institut National Polytechnique de Grenoble - INPG, 2007. Français. ⟨tel-00163788⟩



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