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Etude et réalisation d'une nouvelle cellule TEM à support rotatif pour des mesures CEM des circuits intégrés :
Application du modèle ICEM

Abstract : The quick growth of electronic applications towards higher frequencies requires the development
of new models as well as appropriate measurement methods regarding EMC in integrated circuits (I.C).
TEM cell (Transverse ElectroMagnetic) measurement is one of the key methods making it possible to evaluate
the emission of these circuits. In this thesis, the results of the study, the design and the optimization of a
TEM cell, as well as the development of the ICEM (I ntegrated Circuit Electromagnetic Model) model, will be
presented. After an introduction to several EMC measurement methods for electronic components
according to the IEC (I nternational Electrotechnical Commission) and to various I.C. models, the theoretical
and experimental tools used for our work are introduced. This research contributes to the technological
development of the structure of a TEM cell, as well as to its optimization.
This research focuses mainly on optimization techniques, and especially on 3D electromagnetic
optimization, which leads to the design of a powerful TEM cell with rotating carriers, its main features
being a cut-off frequency close to 3 GHz and a 50Ω characteristic impedance. A test board was designed
in order to evaluate the emission of a microcontroller. The measurement effectiveness of the cell, which
reduces external radio frequency interference thanks to a “protection bell”, is highlighted; it enables to
improve localization accuracy for the elementary emission sources of the component. This study has taken
advantage of the development of the ICEM model of the microcontroller, taking into account many
technological aspects. Finally, within the framework of a MESDIE project, it can be noted that the results
of the design of the TEM cell and of the ICEM model are highly significant to predict any emission of the
integrated circuit before tapeout.
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Submitted on : Friday, April 27, 2007 - 4:08:45 PM
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  • HAL Id : tel-00143891, version 1

Citation

Adil El Abbazi. Etude et réalisation d'une nouvelle cellule TEM à support rotatif pour des mesures CEM des circuits intégrés :
Application du modèle ICEM. Micro et nanotechnologies/Microélectronique. INSA de Rennes, 2006. Français. ⟨tel-00143891⟩

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