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Nouvelle méthode de test en rétention de données de mémoires non volatiles

Abstract : The introduction of non volatile memory in Smartpower circuits has made necessary systematic 100% die data retention test. Usual tests operated on high production volume increase drastically test time. In this work, we propose a new data retention test on non volatile memory. In a first part, we present a state of the art relative to intrinsic and extrinsic NVM defects and to reliability tests. In a second part, we studied thermal NVM data retention behaviour on engineering lot ranging from ambient temperature to 300°C during 7000h. This study allows intrinsic and extrinsic cell discrimination to validate a new data retention test which time is strongly reduced compare to the thermal one: after optimisation phases, test time will be about few seconds and then will be implemented in production flow.
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Contributor : Emilie Marchand <>
Submitted on : Tuesday, March 6, 2007 - 1:15:45 PM
Last modification on : Friday, January 10, 2020 - 9:08:08 PM
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  • HAL Id : tel-00135027, version 1


Laurence Montagner Morancho. Nouvelle méthode de test en rétention de données de mémoires non volatiles. Micro et nanotechnologies/Microélectronique. Institut National Polytechnique de Toulouse - INPT, 2004. Français. ⟨tel-00135027⟩



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