Skip to Main content Skip to Navigation
Theses

Nouvelle méthode de test en rétention de données de mémoires non volatiles

Abstract : The introduction of non volatile memory in Smartpower circuits has made necessary systematic 100% die data retention test. Usual tests operated on high production volume increase drastically test time. In this work, we propose a new data retention test on non volatile memory. In a first part, we present a state of the art relative to intrinsic and extrinsic NVM defects and to reliability tests. In a second part, we studied thermal NVM data retention behaviour on engineering lot ranging from ambient temperature to 300°C during 7000h. This study allows intrinsic and extrinsic cell discrimination to validate a new data retention test which time is strongly reduced compare to the thermal one: after optimisation phases, test time will be about few seconds and then will be implemented in production flow.
Complete list of metadatas

Cited literature [71 references]  Display  Hide  Download

https://tel.archives-ouvertes.fr/tel-00135027
Contributor : Emilie Marchand <>
Submitted on : Tuesday, March 6, 2007 - 1:15:45 PM
Last modification on : Friday, January 10, 2020 - 9:08:08 PM
Long-term archiving on: : Friday, September 21, 2012 - 12:30:16 PM

Identifiers

  • HAL Id : tel-00135027, version 1

Citation

Laurence Montagner Morancho. Nouvelle méthode de test en rétention de données de mémoires non volatiles. Micro et nanotechnologies/Microélectronique. Institut National Polytechnique de Toulouse - INPT, 2004. Français. ⟨tel-00135027⟩

Share

Metrics

Record views

342

Files downloads

1470