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Microscopie photothermique et endommagement laser

Abstract : To study in a non destructive way absorbing localized defects initiating laser damage in optical components, we implement a microscopy set-up with high spatial resolution and high detectivity, based on photothermal deflection method and combined with a laser damage test set-up.
First, optimal configuration is determined thanks to a bibliographical study, a feasibility study and a theoretical comparative study.
In other respects, the role of wavelength on absorption of defects is characterized thanks to a study of spectral properties of absorbing and scattering defects in the UV, visible and IR ranges, for substrates and thin films.
Then, we present the experimental realization of the new set-up. A sub-micronic spatial resolution is obtained.
Finally, this new set-up is applied to the study of gold inclusions of 600 nm embedded in silica. We demonstrate the existence of a “pre-damage” phenomenon: the absorption of inclusions decreases after laser irradiation without any surface alteration.
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Contributor : Laurent Gallais <>
Submitted on : Wednesday, June 28, 2006 - 3:37:48 PM
Last modification on : Tuesday, March 30, 2021 - 3:19:39 AM
Long-term archiving on: : Tuesday, September 18, 2012 - 3:15:22 PM


  • HAL Id : tel-00082735, version 1



Annelise During. Microscopie photothermique et endommagement laser. Physique Atomique [physics.atom-ph]. Université de droit, d'économie et des sciences - Aix-Marseille III, 2002. Français. ⟨tel-00082735⟩



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