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INJECTION DE FAUTES SIMULANT LES EFFETS DE BASCULEMENT DE BITS INDUITS PAR RADIATION

Abstract : Estimating the soft error rate (SER) of digital equipment is a major concern: while the SER of a single bit can be extremely low, the increasing amount of bits per device combined with their use in safetycritical applications makes the SER evaluation an important milestone before introducing a new technology to the market or using it in a space application. To derive the SER of a device, the commonly adopted strategy consists in exposing the tested part to either a particle beam (accelerated test) or to its natural environment while it carries on a given
activity. The difficult point is to exercise the tested chip in a way as representative as possible of the one that
will be used in the final environment. Standards have been published, defining requirements and procedures for SER testing of integrated circuits. However, the procedures presented in these texts apply primarily to memory devices. There is not such an agreement on the SER evaluation of microprocessors. In this context, the work done in this Ph.D. defines a methodology to measure and predict the SER of a processor using a three steps approach: 1) By defining a correct static test strategy allowing to measure the cross-section of the
processor's memory elements; 2) By presenting a detailed analysis of radiation ground testing data, aiming at extracting a statistical model of an accelerated radiation ground test, that is where and when SEUs do
occur in the studied processor; 3) By using this statistical footprint and fault injection techniques to study the behaviour of any application executed by the processor.
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Submitted on : Monday, January 30, 2006 - 4:55:42 PM
Last modification on : Thursday, November 19, 2020 - 3:56:19 PM
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  • HAL Id : tel-00011494, version 1

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F. Faure. INJECTION DE FAUTES SIMULANT LES EFFETS DE BASCULEMENT DE BITS INDUITS PAR RADIATION. Micro et nanotechnologies/Microélectronique. Institut National Polytechnique de Grenoble - INPG, 2005. Français. ⟨tel-00011494⟩

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