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Test et diagnostic de cartes et de MCMs partiellement boundary scan

Abstract : Today's Integrated Circuits are made of millions of transistors, Printed Circuit Boards (PCBs) can have up to ten layers allowing integration of a large number of components and new packaging technologies have appeared, such as 3D packaging or Multi-Chip Modules (MCMs). According to this reality, Test and Diagnostic tasks have become essential for prototype validation and maintenance. The IEEE 1149.1 Boundary Scan Standard (BS) allows to cope with state-of-the art packaging and wiring technologies. Although research evolves from the assumption of full BS availability, industry must face a market which has just started integrating this standard. So, systems will still contain BS parts and non BS clusters in the near future. This thesis aims at finding a global approach for the test and diagnosis of such heterogeneous systems. We propose a methodology which unifies the test and diagnosis ofcomponents and their interconnects. It is based on a scheduling approach to test simultaneously both BS components and non BS clusters, as well as interconnects. Logical stuck-at faults, as well as short and open faults are addressed. Diagnosis is achieved thanks to a novel approach combining structural description and qualitative reasoning to generate fault candidates. A fuzzy logic-based strategy for best test point finding is used to enhance the diagnosis accuracy and efficiency. This methodology, which can be applied to both MCMs and PCBs, has been implemented in a software, nicely interfaced to commercial ATPGs. Obtained experimental results validate this methodology.
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Contributor : Lucie Torella <>
Submitted on : Wednesday, October 26, 2005 - 9:28:15 AM
Last modification on : Friday, December 11, 2020 - 8:28:04 AM
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  • HAL Id : tel-00010767, version 1




M. - H. Touati. Test et diagnostic de cartes et de MCMs partiellement boundary scan. Micro et nanotechnologies/Microélectronique. Institut National Polytechnique de Grenoble - INPG, 1996. Français. ⟨tel-00010767⟩



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