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?. Romain-desplats, F. Beaudoin, P. Perdu, P. Poirier, D. Trémouilles et al., Backside localization of current leakage faults using thermal laser stimulation. Microelectronics Reliability, 12th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, pp.9-101539, 2001.

?. T. Beauchêne, D. Lewis, F. Beaudoin, V. Pouget, R. Desplats et al., Trémouilles : Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. Microelectronic Reliability, XIIIth European Symposium on Reliability of Electron Devices, Failure Physics and Aanalysis, pp.439-444, 2002.

?. David-trémouilles, G. Bertrand, M. Bafleur, F. Beaudoin, P. Perdu et al., TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology, 2002 23rd International Conference on Microelectronics. Proceedings (Cat. No.02TH8595), pp.71-79, 2003.
DOI : 10.1109/MIEL.2002.1003366

?. T. Beauchêne, D. Trémouilles, D. Lewis, P. Perdu, and P. Fouillat, Characterization of ESD induced defects using photovoltaic laser stimulation (PLS) Microelectronics Reliability, XIVth European Symposium on Reliability of Electron Devices, Failure Physics and Aanalysis, pp.9-111577, 2003.

?. D. Trémouilles, M. Bafleur, G. Bertrand, N. Nolhier, and N. Mauran, Lescouzeres : Latch-up ring desing guidelines to improve electrostatic discharges (ESD) protection scheme efficiency, Journal of Solid-State Circuits, vol.39, 2004.

G. Conférences-internationales:-?-david-trémouilles, M. Bertrand, F. Bafleur, and . Beaudoin, Philippe Perdu et Lionel Lescouzeres : TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology, 23rd International Conference on Microelectronics, pp.749-752, 2002.

?. F. Beaudoin, A. Wislez, M. Bafleur, D. Lewis, R. Desplats et al., Trémouilles : Laser beam based ESD defect localization in ICs, 28th International Symposium on Testing and Failure Analysis (ISTFA'2002)

?. T. Beauchêne, D. Lewis, D. Trémouilles, F. Essely, P. Perdu et al., Fouillat : ESD defect localization and analysis using pulsed OBIC techniques, São Paulo, 2003.

?. David-trémouilles, G. Bertrand, M. Bafleur, N. Nolhier, and L. Lescouzeres, Design guidelines to achieve a very high ESD robustness in a self-biased NPN, 24th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD'02), pp.281-288, 2002.

?. David-trémouilles, M. Bafleur, G. Bertrand, and N. Nolhier, Nicolas Mauran et Lionel Lescouzeres : Solving ESD protection latchup guard rings issue during electrostatic discharge (ESD) events, Bipolar/BiCMOS Circuits and Technology Meeting (BCTM'2003), pp.28-2003, 2003.

?. N. Guitard, D. Trémouilles, M. Bafleur, L. Escotte, L. Bary et al., Low frequency noise measurements for ESD latent defect detection in high reliability applications, 15th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2004.

?. David-trémouilles, N. Guitard, and M. Bafleur, Nicolas Nolhier et Lionel Lescouzeres : TLP and photo emission coupling, a powerful tool for study of ESD protection strategy, pp.13-2002

?. T. Beauchêne, D. Lewis, F. Beaudoin, H. Lapuyade, P. Perdu et al., Trémouilles : Thermal laser stimulation and OBIC techniques applied to ESD defect localization, pp.13-2002

?. Marise-bafleur, D. Trémouilles, S. Alves, and F. Beaudoin, Philippe Perdu et Alain Wislez : Impact of CDM ESD stress on CMOS ICs reliability, EOS/EMI, pp.13-2003

?. M. Bafleur, D. Trémouilles, S. Alves, F. Beaudoin, and P. Perdu, Wislez : Impact d'un stress ESD de type CDM sur la fiabilité d'un circuit intégré, eme Atelier Analyse et Mécanismes de Défaillance des Composants pour l'Electronique, Port d'Albret (France), 2002.

?. David and T. , Stratégies de protection intégrées contre les déchargesdéchargesélectrostatiques Comparaison des stress de types HBM et CDM, p.11, 2003.

?. N. Guitard, D. Trémouilles, M. Bafleur, L. Escotte, L. Bary et al., Potentialities of low frequency noise measurement as esd latent defect detection for high reliability applications, pp.39-42

?. F. Essely, D. Trémouilles, N. Guitard, M. Bafleur, P. Perdu et al., Lewis : OBIC techniques applied to study the impact of multiple ESD stresses, pp.35-37

?. N. Guitard, D. Trémouilles, M. Bafleur, L. Escotte, L. Bary et al., Méthode de détection de défauts latents ESD dans les technologies CMOS basée sur des mesures de bruit basse fréquence, 2004.