Injection et détection de charges dans des nanostructures semiconductrices par Microscopie à Force Atomique

Raphaelle Dianoux 1
1 NPSC - Nanophysique et Semiconducteurs
PHELIQS - PHotonique, ELectronique et Ingénierie QuantiqueS : DRF/IRIG/PHELIQS
Abstract : Isolated semiconducting nanostructures have the property to confine charges on long time scales. The charge retention depends on several parameters such as the size of the nanostructure, the density and the quality of the interface with the dielectric. We have investigated these properties with an AFM in air with electrostatic force microscopy (EFM). EFM allows injecting charges locally and then probing, with a sensitivity of a few tens of electrons, the individual as well as collective behaviors of nanostructures. We have characterized the non-linear tip-sample interaction for an electrostatic coupling. We then studied the behavior of Si and Ge nanostructures on SiO2. The saturation of the electron cloud for a network of nanocrystals was evidenced, while kinetic roughening of the electron cloud in a dense network of nanocrystals was observed.
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Contributor : Raphaelle Dianoux <>
Submitted on : Monday, March 21, 2005 - 11:37:44 AM
Last modification on : Tuesday, November 5, 2019 - 2:30:08 PM
Long-term archiving on: Friday, September 14, 2012 - 12:10:24 PM

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Raphaelle Dianoux. Injection et détection de charges dans des nanostructures semiconductrices par Microscopie à Force Atomique. Matière Condensée [cond-mat]. Université Joseph-Fourier - Grenoble I, 2004. Français. ⟨tel-00008831⟩

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