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Caractérisation de l'endommagement de matériaux apatitiques irradiés aux ions lourds et recuits thermiquement

Abstract : Some minerals belonging to the family of apatite are seen to be potential candidates for use as conditioning matrices or transmutation targets for high level nuclear waste management. Indeed, studies of natural nuclear reactors (Oklo) highlighted the strong ability of these minerals to anneal irradiation damage. In order to determine the global behaviour of these materials, we performed a fundamental study on the evolution of irradiation damage induced by various heavy ions in two apatites : a natural phosphocalcic fluorapatite from Durango and a synthetic sintered monosilicated fluorapatite, called britholite. The damage in these materials was measured by using channelling R.B.S. and X-ray diffraction respectively and by determining an amorphisation effective radius Re. The results revealed a similar behaviour for both apatites according to the electronic energy deposit at the entrance of the material. In addition, the effect of an isothermal annealing at 300°C was quantified on a monosilicated britholite previously irradiated with Kr ions. We highlighted in this case the return of the lattice parameters to their initial values, followed by a partial and slow rebuilding of the crystalline lattice versus the annealing time. Finally, we followed the changes in the morphology of etch pits in the Durango fluorapatite after acid dissolution as a function of the energy deposit by the ions. We showed that the influence of crystallography leads quickly to opening angles close to 30°. The calculation of etching velocities within the irradiated material highlighted that there is a range of deposit energy where the velocity ratio increases strongly before becoming constant.
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Submitted on : Thursday, February 24, 2005 - 4:51:26 PM
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Raphaël Tisserand. Caractérisation de l'endommagement de matériaux apatitiques irradiés aux ions lourds et recuits thermiquement. Physique [physics]. Université de Franche-Comté, 2004. Français. ⟨tel-00008573⟩

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