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Techniques d'Auto Réparation pour les Mémoires à Grandes Densités de Défauts

Abstract : Scaling down and integrating more and more electronic components in the chips lead to a significant decrease of the reliability in both production and normal operating mode of the system. Memories that occupy up to 80% of the total area of a System on Chip (SoC), will thus concentrate the most part of the defects. In these conditions, functional and redundant parts of the memory will contain defects. In this thesis innovative self-repair techniques, for RAM memories, have been elaborated. In order to evaluate the efficiency of these repair techniques, a fault injection tool, based on new statistical and/or analytical approaches, have been developed. To mimic realistic fault distributions in the memories, the clustering model have been adopted and integrated in the fault injection tool.
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Submitted on : Wednesday, June 30, 2004 - 10:35:30 AM
Last modification on : Tuesday, February 19, 2019 - 9:38:02 AM
Long-term archiving on: : Friday, April 2, 2010 - 8:09:12 PM


  • HAL Id : tel-00006342, version 1


N.L. Achouri. Techniques d'Auto Réparation pour les Mémoires à Grandes Densités de Défauts. Micro et nanotechnologies/Microélectronique. Institut National Polytechnique de Grenoble - INPG, 2004. Français. ⟨tel-00006342⟩



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