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Etude de la dynamique de charges par microscopie à force électrostatique - Exemple des isolants à grande constante diélectrique

Abstract : An electrostatic force microscope (EFM), made in the laboratory, is used to study both charge injection and dynamic in thin insulating layers (SiO2,Ta2O5, Al2O3). An experimental and theoritical study of the response of the instrument is first performed. The EFM is then used to characterize static charge distribution (corresponding to polarization charges) and mobile charges during the injection and diffusion stages. Several transport regimes are highlighted and associated to the heterogeneity of the trap distribution in the layers, these latter enabling charge transport in the layers. Finally, the spatial resolution of the EFM is used to study the deformation of a charge packet in the direct space under the influence of an electric field parallel to the surface in order to determine the type of transport, dispersive or diffusive, involved in the motion of the charges.
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https://tel.archives-ouvertes.fr/tel-00005195
Contributor : Jérôme Lambert <>
Submitted on : Tuesday, March 2, 2004 - 9:43:46 PM
Last modification on : Wednesday, December 9, 2020 - 3:06:21 PM
Long-term archiving on: : Friday, April 2, 2010 - 8:10:27 PM

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  • HAL Id : tel-00005195, version 1

Citation

Jérôme Lambert. Etude de la dynamique de charges par microscopie à force électrostatique - Exemple des isolants à grande constante diélectrique. Matière Condensée [cond-mat]. Université Paris-Diderot - Paris VII, 2003. Français. ⟨tel-00005195⟩

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