284 articles – 2152 Notices  [english version]
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Sampling Theory in Signal and Image Processing
Fesquet L. et al
(2011) Vol. 10, N°1-2 [hal-00688417 - version 1]
Integrated Circuit and System Design. Power and Timing Modeling, Optimization, and Simulation 21st International Workshop, PATMOS 2011, Madrid, Spain, September 26-29, 2011. Proceedings
Ayala J.L. et al
(2011) 350 [hal-00653478 - version 1]
fulltext access SAMPTA'09, International Conference on SAMPling Theory and Applications
Fesquet L. et al
(2010) 384 [hal-00495456 - version 1]
Advances in Design Methods from Modeling Languages for Embedded Systems and SoC's
Borrione D.
(2010) 246 p., Vol.63 [hal-00492974 - version 1]
System Level Design with .NET Technology
Aboulhamid E.M. et al
(2009) 328 [hal-00472595 - version 1]
Proceedings of Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP 2008), Cannes, France, April 9-11
Bright V. et al
(2008) pp [hal-00354566 - version 1]
THERmal Investigations of ICs and Systems (THERMINIC'08)
Courtois B. et al
(2008) 253 p. [hal-00348337 - version 1]
Plateforme CAO pour le test de circuits mixtes
Bounceur A.
(2007) 160 [hal-00521998 - version 1]
Global Specification and Validation of Embedded Systems: Integrating Heterogeneous Components
Jerraya A.A. et al
(2007) pp [hal-00472597 - version 1]
VLSI-SoC: Research Trends in VLSI and Systems on Chip
De Micheli G. et al
(2007) 410 [hal-00199213 - version 1]
THERmal Investigations of ICs and Systems (THERMINIC'07)
Courtois B. et al
(2007) 228 p. [hal-00192072 - version 1]
Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP 2007)
Courtois B. et al
(2007) 385 p. [hal-00192030 - version 1]
Proceedings on 14th IFIP International Conference on Very Larage Scale Integration (VLSI-SoC'06)
Mir S. et al
(2006) 416 p. [hal-00144749 - version 1]
Design, Test, Integration of MEMS/MOEMS (DTIP 2005): special issue of Journal on Microsystem Technologies
Courtois B. et al
(2006) 1063-1124 [hal-00144743 - version 1]
Forum of Digest Papers of 14th IFIP International Conference on Very Larage Scale Integration (VLSI-SoC'06)
Mir S. et al
(2006) 83 [hal-00144730 - version 1]
Correct Hardware Design and Verification Methods
Borrione D. et al
(2005) 412 p. [hal-00185952 - version 1]
Microelectronics Journal, Special Issue on IMSTW 2004 - International Mixed-Signals Testing Works, Volume 36, Issue 12
Kaminska B. et al
(2005) 1063-1124 [hal-00079402 - version 1]
Proceedings of 11th IEEE International On-Line Testing Symposium (IOLT 2005)Saint Raphael, French Riviera, France, July 6-8, 2005
Nicolaidis M. et al
(2005) 330 pages [hal-00016849 - version 1]
Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP 2004), 12-14 May 2004, Montreux, Switzerland: Special Issue, Analog Integrated Circuits and Signal Processing
Courtois B.
(2005) Volume 44, Number 2, 107-183 [hal-00016815 - version 1]
Proceedings of Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP 2005), Montreux,Switzerland, June 1-3, 2005
Courtois B. et al
(2005) 422 pages [hal-00016756 - version 1]