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1240 documents classés par : Date Titre Nom du premier auteur Type de documents Date de dépôt

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Efficient minimization of test frequencies for linear analog circuits Bentobache M. et al In ETS 2013 - 18th IEEE European Test Symposium (ETS), France (2013) [hal-00789857 - version 1]

Multivariate Statistical Techniques for Analog Parametric Test Metrics Estimation Huang K. et al Dans DTIS 2013 - DTIS 2013, Émirats Arabes Unis (2013) [hal-00780022 - version 1]

Parametric test metrics estimation using statistical modelling, In IEEE International Conference on Design & Technology of Integrated Systems Beznia K. et al Dans IEEE International Conference on Design & Technology of Integrated Systems in nanoscale era (DTIS'13) - IEEE International Conference on Design & Technology of Integrated Systems in nanoscale era (DTIS'13), France (2013) [hal-00765157 - version 1]

Data Mining MPSoC Simulation Traces to Identify Concurrent Memory Access Patterns Lagraa A. et al Dans Proc. of Design Automation and Test in Europe Conference (DATE'13) - Design Automation and Test in Europe Conference (DATE'13), France (2013) [hal-00817027 - version 1]

Accurate Estimation of Analog Test Metrics With Extreme Circuits Beznia K. et al Dans In IEEE International Conference on Electronics, Circuits, and Systems (ICECS) - In IEEE International Conference on Electronics, Circuits, and Systems (ICECS), Espagne (2012) [hal-00765175 - version 1]

A Tool for Statistical Modelling by Means of Copulas of Analog and Mixed-Signal Circuits Bounceur A. et al Dans In 27th conference on Design of Circuits and Integrated Systems (DCIS'12) - In 27th conference on Design of Circuits and Integrated Systems (DCIS'12), France (2012) [hal-00765185 - version 1]

Modeling of thin resistive sheets in the Ddscontinuous Galerkin method for shielding evaluation Boubekeur M. et al Dans Proceedings of the 15th Biennial IEEE Conference on Electromagnetic Field Computation - IEEE CEFC 2012, Japon (2012) [hal-00783302 - version 1]

Emulation platform for an adaptive NoC-based MPSoC architecture dedicated to spectral imaging for art authentication Tan J. et al Dans International Conference on Image Processing Theory, Tools and Applications - IPTA 2012 : International Conference on Image Processing Theory, Tools and Applications, Turquie (2012) [ujm-00738494 - version 1]

Case study: deployment of the 2D NoC on 3D for the generation of large emulation platforms. Fresse V. et al Dans IEEE International Symposium on Rapid System Prototyping - IEEE International Symposium on Rapid System Prototyping, Finlande (2012) [ujm-00738489 - version 1]

Performance evaluation of centralized maintenance workshop by using Queuing Networks Simeu-Abazi Z. et al Dans AMEST'2012 - Advanced Maintenance Engineering, Services and Technology AMEST' 2012,, Espagne (2012) [hal-00787542 - version 1]

Une application efficace du problème de recouvrement au test de circuits analogiques Bentobache M. et al In 13e congrès annuel de la Société française de Recherche Opérationnelle et d'Aide à la Décision - ROADEF 2012, France (2012) [hal-00678609 - version 1]

Comparison of Self-Timed Ring and Inverter Ring Oscillators as Entropy Sources in FPGAs Cherkaoui A. et al In Proceedings of Design Automation and Test in Europe (DATE 2012) - Design Automation and Test in Europe (DATE 2012), Germany (2012) [ujm-00667639 - version 1]

Reliability Challenges of Real-Time Systems in Forthcoming Technology Nodes Hamdioui S. et al Dans Proc. of Design Automation and Test in Europe Conference (Date'12) - Design Automation and Test in Europe Conference (Date'12), France (2012) [hal-00816027 - version 1]

Case Study of SEU Effects in a Network Processor Evans A. et al Dans Proc. of IEEE Workshop on Silicon Errors in Logic - System Effects (SELSE) - IEEE Workshop on Silicon Errors in Logic - System Effects (SELSE), États-Unis (2012) [hal-00815995 - version 1]

Test algorithms for ECC-based memory repair in nanotechnologies Papavramidou P. et al Dans Proc.of IEEE VLSI Test Symposium (VTS) - IEEE VLSI Test Symposium (VTS), États-Unis (2012) [hal-00815986 - version 1]

Designing Robust Single-Chip Massively-Parallel Tera-Device Processors Nicolaidis M. Dans Proc of 4th Design for Reliability Workshop (DFR) - Proc. of 4th Design for Reliability Workshop (DFR), France (2012) [hal-00815969 - version 1]

Experimental Assessment of Cache Memory Soft Error Rate Prediction Technique Houssany S. et al Dans Proc. of 13th European Conference on Radiation and its Effects on Components and Systems (RADECS) - 13th European Conference on Radiation and its Effects on Components and Systems (RADECS), France (2012) [hal-00815960 - version 1]

A Formal Framework for Testing with Assertion Checkers in Mixed-Signal Simulation Pierre L. Dans Proc. of IEEE International Conference on Electronics, Circuits, and Systems (ICECS'2012) - IEEE International Conference on Electronics, Circuits, and Systems (ICECS'2012), Espagne (2012) [hal-00815923 - version 1]

New smart readout technique performing edge detection designed to control vision sensors dataflow Amhaz H. et al In Proc. of 24th IS&T/SPIE Electronic Imaging Conference, Burlingame, California, United States, January 22-26 - 24th IS&T/SPIE Electronic Imaging Conference, United States (2012) [hal-00815817 - version 1]

Fast simulation of systems embedding VLIW processors Michel L. et al Dans Proc. of IEEE/ACM/IFIP international conference on Hardware/software codesign and system synthesis (CODES+ISSS), Tampere, Finland, October 7-12 - IEEE/ACM/IFIP international conference on Hardware/software codesign and system synthesis (CODES+ISSS), Finlande (2012) [hal-00815815 - version 1]