248 articles – 2008 Notices  [english version]
.:. Consultation > Liste par type de publication > Articles dans des revues avec comité de lecture .:.
414 documents classés par :
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restricted file access Single glucose biofuel cells implanted in rats power electronic devices.
Zebda A. et al
Sci Rep 3 (2013) 1516 [hal-00809303 - version 1]
Modular Modelling for the Diagnostic of Complex Discrete-Event Systems
Eric G. et al
IEEE Transactions on Automation Science and Engineering 9, 4 (2013) 1100-1125 [hal-00787538 - version 1]
An asynchronous FPGA block with its tech-mapping algorithm dedicated to security applications
Beyrouthy T. et al
International Journal of Reconfigurable Computing 2013, Article ID 517947 (2013) 12 pages [hal-00819126 - version 1]
Optimizing Construction of Scheduled Data Flow Graph for Online testability
Kamsu Foguem B. et al
The Mediterranean Journal of Computers and Networks 8, 4 (2012) 125-133 [hal-00819170 - version 1]
Design of tracking loop with dirty templates for UWB communication systems
Alhakim R. et al
Signal Image and Video Processing Journal June (2012) 1-7 [hal-00819166 - version 1]
Strain microgauge implementation on cylindrical metal substrates
Yang W. et al
Microelectronic Engineering 97, September (2012) 285-288 [hal-00817861 - version 1]
Pressure and temperature dependence of GaN/AlGaN high electron mobility transistor based sensors on a sapphire membrane
Edwards M.J. et al
PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS 9, 3-4 (2012) 960-963 [hal-00817852 - version 1]
Microprocessor Soft Error Rate Prediction Based on Cache Memory Analysis
Houssany S. et al
IEEE Transactions on Nuclear Science 59, 4, Part 1 (2012) 980-987 [hal-00817844 - version 1]
Biologically Inspired Robust Tera-Device Processors
Nicolaidis M.
IEEE Design and Test of Computers 29, No.5, September/October (2012) 94-99 [hal-00817030 - version 1]
Kth-Aggressor Fault (KAF)-based Thru-Silicon-Via Interconnect Built-In Self-Test and Diagnosis
Pasca V. et al
Journal of Electronic Testing: Theory and Application 28 (2012) Online First™, 3 August [hal-00744561 - version 1]
Adaptive Gain and Analog Wavelet Transform for Low-Power Infrared Image Sensors
Villard P. et al
Active and Passive Electronic Components Journal (APEC) 2012, Article ID 610176 (2012) 6 [hal-00744450 - version 1]
Native Simulation of MPSoC Using Hardware-Assisted Virtualization
Shen H. et al
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 31, 7 (2012) 1074 - 1087 [hal-00744439 - version 1]
A Fault Tolerant Approach to Detect Transient Faults in Microprocessors Based on a Non-Intrusive Reconfigurable Hardware
Azambuja J.R. et al
IEEE Transactions on Nuclear Science 59, 4 (2012) 1117 - 1124 [hal-00744240 - version 1]
Improving SEU Fault Tolerance Capabilities of a Self-Converging Algorithm
Velazco R. et al
IEEE Transactions on Nuclear Science 59, 4 (2012) 818 - 823 [hal-00744228 - version 1]
Adaptive Alternate Analog Test
Stratigopoulos H. et al
IEEE Design and Test of Computers 29, 04 (2012) 71-79 [hal-00743573 - version 1]
Test Metrics Model for Analog Test Development
Stratigopoulos H.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 31, 7 (2012) 1116 - 1128 [hal-00743570 - version 1]
Diagnosis of Local Spot Defects in Analog Circuits
Huang K. et al
IEEE Transactions on Instrumentation and Measurement 61, 10 (2012) 2701 - 2712 [hal-00743568 - version 1]
CSL: Configurable Fault Tolerant Serial Links for Inter-die Communication in 3D Systems
Pasca V. et al
Journal of Electronic Testing 28, 1 (2012) 137-150 [hal-00650169 - version 1]
fulltext access Estimation of Analog Parametric Test Metrics Using Copulas
Bounceur A. et al
IEEE Trans. on CAD of Integrated Circuits and Systems TCAD 9, 30 (2011) 1400-1410 [hal-00648885 - version 1]
On MPSoC Software Execution at the Transaction Level
Pétrot F. et al
IEEE Design & Test of Computers 28, 3 (2011) 32-43 [hal-00680474 - version 1]