285 articles – 2153 Notices  [english version]
.:. Consultation > Liste par année > 1991 .:.
18 documents classés par :

Synthesis of controllers with concurrent checking: method and case studies
Leveugle R.
L'onde Electrique May-June ; 71(3) (1991) 69-75 [hal-00015252 - version 1]
A new approach to control flow checking without program modification
Michel T. et al
Dans Digest-of-Papers.-Fault-Tolerant-Computing:-Twenty-First-International-Symposium-Cat.-No.91CH2985-0. - Digest-of-Papers.-Fault-Tolerant-Computing:-Twenty-First-International-Symposium-Cat.-No.91CH2985-0., Canada (1991) [hal-00015242 - version 1]
Hierarchical test generation based on delayed propagation
Karam J.M. et al
Dans Proceedings.-International-Test-Conference-1991-IEEE-Cat.-No.91CH3032-0 - Proceedings.-International-Test-Conference-1991-IEEE-Cat.-No.91CH3032-0, États-Unis (1991) [hal-00015238 - version 1]
Comprehensive CAD support for boundary scan implementation in ASICs
Lestrat P. et al
Dans Euro-ASIC-'91-Cat.-No.91TH0367-3. - Euro-ASIC-'91-Cat.-No.91TH0367-3., France (1991) [hal-00015236 - version 1]
OCAPI: architecture of a VLSI coprocessor for the GCD and the extended GCD of large numbers
Guyot A.
Dans Proceedings.-10th-IEEE-Symposium-on-Computer-Arithmetic-Cat.-No.91CH3015-5. - Proceedings.-10th-IEEE-Symposium-on-Computer-Arithmetic-Cat.-No.91CH3015-5., France (1991) [hal-00014974 - version 1]
Shorts in self-checking circuits
Nicolaidis M.
Journal-of-Electronic-Testing:-Theory-and-Applications Jan. ; 1(4) (1991) 257-73 [hal-00014039 - version 1]
Silicon compilation of hierarchical control sections with unified BIST testability
Nicolaidis M. et al
Microprocessors and Microsystems June ; 15(5) (1991) 257-69 [hal-00014036 - version 1]
A self-checking PLA automatic generator tool based on unordered codes encoding
Torki K. et al
Dans EDAC.-Proceedings-of-the-European-Conference-on-Design-Automation. 1991: - EDAC.-Proceedings-of-the-European-Conference-on-Design-Automation. 1991:, Pays-Bas (1991) [hal-00014034 - version 1]
New implementations, tools, and experiments for decreasing self-checking PLAs area overhead
Nicolaidis M. et al
Dans IEEE-International-Conference-on-Computer-Design:-VLSI-in-Computers-and-Processors-Cat.-No.91CH3040-3. - IEEE-International-Conference-on-Computer-Design:-VLSI-in-Computers-and-Processors-Cat.-No.91CH3040-3., États-Unis (1991) [hal-00014033 - version 1]
Built-in self-test in multi-port RAMs
Castro-Alves V. et al
Dans 1991-IEEE-International-Conference-on-Computer-Aided-Design.-Digest-of-Technical-Papers-91CH3026-2 - 1991-IEEE-International-Conference-on-Computer-Aided-Design.-Digest-of-Technical-Papers-91CH3026-2, États-Unis (1991) [hal-00014014 - version 1]
A tool for computation of output code spaces in complex self-checking systems
Boudjit M. et al
Dans Proceedings.-Pacific-Rim-International-Symposium-on-Fault-Tolerant-Systems-Cat.-No.91TH0384-8 - Proceedings.-Pacific-Rim-International-Symposium-on-Fault-Tolerant-Systems-Cat.-No.91TH0384-8, États-Unis (1991) [hal-00014008 - version 1]
VLSI architectural assessment of standard image coding systems
Privat G. et al
Annales des Télécommunications 46(1-2) (1991) 121-41; Jan.-Feb. [hal-00012570 - version 1]
An a priori approach to the evaluation of signature analysis efficiency
Caspi P. et al
IEEE Transactions on Computers Sept. 1991; 40(9) (1991) 1068-71 [hal-00008270 - version 1]
Physical fault injection: a suitable method for the evaluation of functional test efficiency
Velazco R. et al
Dans Proceedings.-1991-International-Workshop-on-Defect-and-Fault-Tolerance-on-VLSI-Systems - (1991) [hal-00008269 - version 1]
Photoconductivity and fluorescence properties of divalent ytterbium ions in fluoride crystals
Moine B. et al
Journal of Luminescence Volumes 48-49, Part 2 , January-February 1991 (1991) 501-504 [hal-00007967 - version 1]
Photoionization and luminescences in BaF/sub 2/:Eu/sup 2
Moine B. et al
Journal of Luminescence Volume 50, Issue 1 , May-June 1991 (1991) 31-38 [hal-00007966 - version 1]
Coupling electron-beam probing with knowledge-based fault localization
Marzouki M. et al
Dans Proceedings.-International-Test-Conference-1991-IEEE - (1991) [hal-00007960 - version 1]
Built-in self-test in multi-port RAMs
Castro-Alves V. et al
Dans 1991-IEEE-International-Conference-on-Computer-Aided-Design.-Digest-of-Technical - (1991) [hal-00007959 - version 1]