248 articles – 2008 Notices  [english version]
.:. Consultation > Liste par année > 1988 .:.
14 documents classés par :
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fulltext access Le test des PLAs optimisés topologiquement
Fernandes A.-O.
Institut National Polytechnique de Grenoble - INPG (09/09/1988), Bernard Courtois (Dir.) [tel-00330517 - version 1]
Design of a microprocessor with integrated on-line test for highly dependable systems
Leveugle R. et al
L'onde Electrique Nov.-Dec. ; 68(6) (1988) 59-66 [hal-00015363 - version 1]
Strongly code disjoint checkers
Nicolaidis M. et al
IEEE Transactions on Computers June ; 37(6) (1988) 751-6 [hal-00014062 - version 1]
A unified built-in-test scheme: UBIST
Nicolaidis M.
Dans Eighteenth-International-Symposium-on-Fault-Tolerant-Computing.-Digest-of-Papers.-FTCS-18-Cat.-No.88CH2543-7 - Eighteenth-International-Symposium-on-Fault-Tolerant-Computing.-Digest-of-Papers.-FTCS-18-Cat.-No.88CH2543-7, Japon (1988) [hal-00014061 - version 1]
UBIST version of the SYCO's control section compiler
Torki K. et al
Dans Proceedings-of-the-1988-IEEE-International-Conference-on-Computer-Design:-VLSI-in-Computers-and-Processors-ICCD-'88-Cat.-No.88CH2643-5 - Proceedings-of-the-1988-IEEE-International-Conference-on-Computer-Design:-VLSI-in-Computers-and-Processors-ICCD-'88-Cat.-No.88CH2643-5, États-Unis (1988) [hal-00014060 - version 1]
Definition and design of strongly language disjoint checkers
Jansch I. et al
IEEE Transactions on Computers June; 37(6) (1988) 745-8 [hal-00013402 - version 1]
Fault simulation and test pattern generation at the multiple-valued switch level
Caisso J.-P. et al
Dans International-Test-Conference-1988-Proceedings-New-Frontiers-in-Testing-Cat.-No.88CH2610-4 - International-Test-Conference-1988-Proceedings-New-Frontiers-in-Testing-Cat.-No.88CH2610-4, États-Unis (1988) [hal-00013401 - version 1]
Testing integrated circuits from an ergonomic point of view: the expert system PESTICIDE
Marzouki M. et al
Dans ERGO-IA-'88.-Colloque-Europeen-Ergonomie-et-Intelligence-Artificielle.-Actes-ERGO-IA-'88.-European-Colloquium-Ergonomics-and-Artificial-Intelligence.-Proceedings. - ERGO-IA-'88.-Colloque-Europeen-Ergonomie-et-Intelligence-Artificielle.-Actes-ERGO-IA-'88.-European-Colloquium-Ergonomics-and-Artificial-Intelligence.-Proceedings., France (1988) [hal-00013399 - version 1]
Analysis of experimental results on functional testing and diagnosis of complex circuits
Bellon C. et al
Dans International-Test-Conference-1988-Proceedings-New-Frontiers-in-Testing-Cat.-No.88CH2610-4 - International-Test-Conference-1988-Proceedings-New-Frontiers-in-Testing-Cat.-No.88CH2610-4, États-Unis (1988) [hal-00013338 - version 1]
SYCO-a silicon compiler for VLSI ASICs specified by algorithms
Jerraya A.A. et al
Computer Aided Engineering Journal 5(3): June (1988) 122-30 [hal-00013324 - version 1]
CPC: a control section synthesizer
Jerraya A.A. et al
Dans Proceedings-of-the-8th-International-Custom-Microelectronics-Conference - Proceedings-of-the-8th-International-Custom-Microelectronics-Conference, Royaume-Uni (1988) [hal-00013320 - version 1]
CORDIC-based digital signal processing hardware algorithms
Privat G. et al
Traitement du Signal 5(6) (1988) 421-34 [hal-00012573 - version 1]
Strongly Code Disjoint Checkers
Nicolaidis M. et al
IEEE Transactions on Computers June 1988 (Vol. 37, No. 6) (1988) 751-756 [hal-00007994 - version 1]