282 articles – 2123 Notices  [english version]
Fiche détaillée Communications avec actes
XVth IBERCHIP Workshop, Buenos Aires : Argentine (2009)
High altitude experiments to evaluate SEU sensitivity of advanced SRAMs
R. Velazco1, P. Peronnard1, C. Silva Cardenas2, S. Fernandez2

Integrated circuits are sensitive to the effects of natural radiation. This paper describes the test platforms developped to perform high altitude experiments devoted to obtain SEU error-rates of SRAMs operating at high altitude. Two experiments were developped using a Gbyte memory board. The first was installed in the payload of a balloon flying at about 30000 mts, the second one being runing at 3800 mts above sea level in the city of Cusco, Peru. Preliminary resulta are shown and discussed.
1 :  TIMA - Techniques of Informatics and Microelectronics for integrated systems Architecture
2 :  Departamento de Biología Vegetal
SRAM – SEU