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A low-cost digital frequency testing approach for mixed-signal devices using ΣΔ modulation
Prenat G. et al
Microelectronics Journal Vol.36, No.12 (2005) 1080-1090 - http://hal.archives-ouvertes.fr/hal-00079373
G. Prenat1, S. Mir1, D. Vazquez2, L. Rolindez1
1 :  TIMA - Techniques of Informatics and Microelectronics for integrated systems Architecture
http://tima.imag.fr/
CNRS : UMR5159 – Université Joseph Fourier - Grenoble I – Institut National Polytechnique de Grenoble (INPG)
46 Av Félix Viallet 38031 GRENOBLE CEDEX 1
France
2 :  CNM - Instituto de Microelectrónica de Sevilla
Centro Nacional de Microelectronica
Edificio CICA, Avda Reina Mercedes s/n 41012 Sevilla
Espagne
Sciences de l'ingénieur/Micro et nanotechnologies/Microélectronique
A low-cost digital frequency testing approach for mixed-signal devices using ΣΔ modulation
This paper presents a digital approach to frequency testing of Analogue and mixed-signal (AMS) circuits. This approach is aimed at facilitating low-cost test techniques for system-on-chip (SoC) devices, rendering the test of mixed-signal cores compatible with the use of a low-cost digital tester. Analogue test signal generation is performed on-chip by low pass filtering a sigma–delta (ΣΔ) encoded bit-stream. Analogue harmonic test response analysis is also performed on-chip using square wave modulation and ΣΔ modulation. Since both analogue signal generation and test response analysis are digitally programmable on-chip, compatibility with a low-cost digital tester is ensured. Optimisation of test signatures is discussed in detail as a trade-off between fault and yield coverage. A 0.18 μm CMOS implementation of this BIST technique is presented, including some experimental results.
Anglais

10.1016/j.mejo.2005.04.062
Microelectronics Journal
2005
Vol.36, No.12
1080-1090

Analogue and mixed-signal – system-on-chip
PACS 85.42