| Auteur(s) |
G. Prenat1, S. Mir1, D. Vazquez2, L. Rolindez1 |
| Laboratoire |
|
| Domaine |
Sciences de l'ingénieur/Micro et nanotechnologies/Microélectronique
|
| Titre |
A low-cost digital frequency testing approach for mixed-signal devices using ΣΔ modulation |
| Résumé |
This paper presents a digital approach to frequency testing of Analogue and mixed-signal (AMS) circuits. This approach is aimed at facilitating low-cost test techniques for system-on-chip (SoC) devices, rendering the test of mixed-signal cores compatible with the use of a low-cost digital tester. Analogue test signal generation is performed on-chip by low pass filtering a sigma–delta (ΣΔ) encoded bit-stream. Analogue harmonic test response analysis is also performed on-chip using square wave modulation and ΣΔ modulation. Since both analogue signal generation and test response analysis are digitally programmable on-chip, compatibility with a low-cost digital tester is ensured. Optimisation of test signatures is discussed in detail as a trade-off between fault and yield coverage. A 0.18 μm CMOS implementation of this BIST technique is presented, including some experimental results. |
| Langue du texte intégral |
Anglais |
|
| DOI |
10.1016/j.mejo.2005.04.062 |
| Journal |
Microelectronics Journal |
| Date de publication |
2005 |
| Volume |
Vol.36, No.12 |
| Page, identifiant, ... |
1080-1090 |
|
| Mots Clés |
Analogue and mixed-signal – system-on-chip |
| Classification |
PACS 85.42 |
|
