| Auteur(s) |
A. Wahba1, D. Borrione2 |
| Laboratoire |
|
| Domaine |
Sciences de l'ingénieur/Micro et nanotechnologies/Microélectronique
|
| Titre |
Automatic diagnosis may replace simulation for correcting simple design errors |
| Résumé |
An automated tool for diagnosing simple design errors in VHDL description is presented. The tool is tested on benchmark circuits, and the results show that the error is localized precisely, after the application of a small number of specially generated test patterns. This tool is now integrated within the PREVAIL/sup TM/ system, and is being tested on industrial circuits. |
| Langue du texte intégral |
Anglais |
|
| DOI |
10.1109/EURDAC.1996.558246 |
| Titre de l'ouvrage |
Proceedings-EURO-DAC-'96.-European-Design-Automation-Conference-with-EURO-VHDL-'96-and-Exhibition-Cat.-No.96CB36000 |
| Date de publication |
1996 |
| Page, identifiant, ... |
476-81 |
| Éditeur commercial |
IEEE Comput. Soc. Press, Los Alamitos, CA, USA |
|
| Titre de la conférence |
Proceedings-EURO-DAC-'96.-European-Design-Automation-Conference-with-EURO-VHDL-'96-and-Exhibition-Cat.-No.96CB36000 |
| Date de la conférence |
1996 |
| Ville |
Geneva |
| Pays |
Suisse |
|
| Mots Clés |
automatic-diagnosis – simple-design-error-correction – VHDL-description – benchmark-circuits – specially-generated-test-patterns – industrial-circuits – combinational-circuits – sequential-circuits – test-pattern-generation |
| Classification |
PACS 85.42 |
| Commentaire |
ISBN: 081867573X |
|
