| Auteur(s) |
M. Nicolaidis ( )1, 2 |
| Laboratoire |
|
| Domaine |
Sciences de l'ingénieur/Micro et nanotechnologies/Microélectronique
|
| Titre |
Efficient UBIST implementation for microprocessor sequencing parts |
| Résumé |
An improved self-checking solution for the sequencing part of the MC 68000 microprocessor is presented. Compared with previous self-checking schemes for this microprocessor, the present scheme makes its possible to reduce the overhead and simplifies the implementation of both functional circuits, and checkers. The unified BIST (built-in self-test) method is applied to this scheme. This method uses a merging of self-checking and BIST techniques and allows a high fault coverage for all tests needed for integrated circuits, e.g., offline test (design verification, manufacturing, and maintenance test) and online concurrent error detection. An area overhead of about 27% is required, which is quite satisfactory in comparison with previous results. |
| Langue du texte intégral |
Anglais |
|
| DOI |
10.1109/TEST.1990.114038 |
| Titre de l'ouvrage |
Proceedings-International-Test-Conference-1990-Cat.-No.90CH2910-6. |
| Date de publication |
1990 |
| Page, identifiant, ... |
316-26 |
| Éditeur commercial |
IEEE Comput. Soc. Press, Los Alamitos, CA, USA |
|
| Titre de la conférence |
Proceedings-International-Test-Conference-1990-Cat.-No.90CH2910-6. |
| Date de la conférence |
1990 |
| Ville |
Washington, DC |
| Pays |
États-Unis |
|
| Mots Clés |
logic-testing – production-testing – mentation-for-microprocessor-sequencing – self-checking – MC-68000-microprocessor – functional-circuits – unified-BIST – fault-coverage – integrated-circuits – offline-test – design-verification – maintenance-test – online-concurrent-error-detection – area-overhead |
| Classification |
PACS 85.42 |
| Commentaire |
ISBN: 081869064X |
|
