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Efficient UBIST implementation for microprocessor sequencing parts
Nicolaidis M.
Dans Proceedings-International-Test-Conference-1990-Cat.-No.90CH2910-6. - Proceedings-International-Test-Conference-1990-Cat.-No.90CH2910-6., Washington, DC : États-Unis (1990) - http://hal.archives-ouvertes.fr/hal-00014037
M. Nicolaidis ()1, 2
1 :  IROC TECHNOLOGIES - iROc Technologies
http://www.iroctech.com/
Cadence Connection – EDA Consortium – FSA – Cubic Micro
WTC Po Box 1510 Grenoble
France
2 :  TIMA - Techniques of Informatics and Microelectronics for integrated systems Architecture
http://tima.imag.fr/
CNRS : UMR5159 – Université Joseph Fourier - Grenoble I – Institut National Polytechnique de Grenoble (INPG)
46 Av Félix Viallet 38031 GRENOBLE CEDEX 1
France
Sciences de l'ingénieur/Micro et nanotechnologies/Microélectronique
Efficient UBIST implementation for microprocessor sequencing parts
An improved self-checking solution for the sequencing part of the MC 68000 microprocessor is presented. Compared with previous self-checking schemes for this microprocessor, the present scheme makes its possible to reduce the overhead and simplifies the implementation of both functional circuits, and checkers. The unified BIST (built-in self-test) method is applied to this scheme. This method uses a merging of self-checking and BIST techniques and allows a high fault coverage for all tests needed for integrated circuits, e.g., offline test (design verification, manufacturing, and maintenance test) and online concurrent error detection. An area overhead of about 27% is required, which is quite satisfactory in comparison with previous results.
Anglais

10.1109/TEST.1990.114038
Proceedings-International-Test-Conference-1990-Cat.-No.90CH2910-6.
1990
316-26
IEEE Comput. Soc. Press, Los Alamitos, CA, USA

Proceedings-International-Test-Conference-1990-Cat.-No.90CH2910-6.
1990
Washington, DC
États-Unis

logic-testing – production-testing – mentation-for-microprocessor-sequencing – self-checking – MC-68000-microprocessor – functional-circuits – unified-BIST – fault-coverage – integrated-circuits – offline-test – design-verification – maintenance-test – online-concurrent-error-detection – area-overhead
PACS 85.42
ISBN: 081869064X