279 articles – 2094 Notices  [english version]
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A multiple fault injection methodology based on cone partitioning towards RTL modeling of laser attacks
Papadimitriou A. et al
In Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014 - Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014, Germany (2014) [hal-00981848 - version 1]
fulltext access New techniques for selecting test frequencies for linear analog circuits
Bentobache M. et al
Dans International Conference on Very Large Scale Integration (VLSI-SoC) - International Conference on Very Large Scale Integration (VLSI-SoC), Turquie (2013) [hal-00855154 - version 1]
FlexOE: A Congestion-Aware Routing Algorithm for NoCs
Alcantara De Lima O. et al
In IEEE International Symposium on Rapid System Prototyping - IEEE International Symposium on Rapid System Prototyping, Canada (2013) [ujm-00870338 - version 1]
Adaptive NoC-based system for spectral imaging algorithm to art authentication
Fresse V. et al
In spectral imaging, adaptive architecture, real time system, MPSoC, NoC, performance exploration - 21st European Signal Processing Conference Eusipco, Morocco (2013) [ujm-00857991 - version 1]
FlexOE : Un Algorithme de Routage Adaptatif pour le contrôle de Congestion dans les Réseaux sur Puce
Alcantara De Lima O. et al
In Colloque national sur le traitement du signal et des images Gretsi - Colloque national sur le traitement du signal et des images Gretsi, France (2013) [ujm-00857978 - version 1]
fulltext access A Very High Speed True Random Number Generator with Entropy Assessment
Cherkaoui A. et al
In Cryptographic Hardware and Embedded Systems -- CHES 2013 - Cryptographic Hardware and Embedded Systems -- CHES 2013 15th International Workshop on Cryptographic Hardware and Embedded Systems -- CHES 2013, United States (2013) [ujm-00859906 - version 1]
Efficient minimization of test frequencies for linear analog circuits
Bentobache M. et al
In ETS 2013 - 18th IEEE European Test Symposium (ETS), France (2013) [hal-00789857 - version 1]
fulltext access A Self-timed Ring Based True Random Number Generator
Cherkaoui A. et al
In proceedings of ASYNC 2013 (International symposium on advanced research in asynchronous circuits and systems) - International symposium on advanced research in asynchronous circuits and systems - ASYNC 2013, United States (2013) [ujm-00840593 - version 1]
fulltext access Multivariate Statistical Techniques for Analog Parametric Test Metrics Estimation
Huang K. et al
In DTIS 2013 - DTIS 2013, United Arab Emirates (2013) [hal-00780022 - version 1]
Parametric test metrics estimation using statistical modelling
Beznia K. et al
In IEEE International Conference on Design & Technology of Integrated Systems in nanoscale era (DTIS'13) - IEEE International Conference on Design & Technology of Integrated Systems in nanoscale era (DTIS'13), France (2013) [hal-00765157 - version 1]
Data Mining MPSoC Simulation Traces to Identify Concurrent Memory Access Patterns
Lagraa S. et al
Dans Proceedings of the Conference on Design, Automation and Test in Europe (DATE) - DATE 2013 - Conference on Design, Automation and Test in Europe, France (2013) [hal-00817027 - version 1]
Reduced code linearity testing of pipeline adcs in the presence of noise
Laraba A. et al
Dans IEEE VLSI Test Symposium (VTS'13) - IEEE VLSI Test Symposium (VTS'13), Berkeley, CA, USA, April 29 - May 02, États-Unis (2013) [hal-00975951 - version 1]
Defect-Oriented Non-Intrusive RF Test Using On-Chip Temperature Sensors
Abdallah L. et al
Dans IEEE VLSI Test Symposium (VTS'13) - IEEE VLSI Test Symposium (VTS'13), , USA, April 29 - May 02, États-Unis (2013) [hal-00975942 - version 1]
Multidimensional analog test metrics estimation using extreme value theory and statistical blockade
Mohamed F. et al
Dans 50th ACM / EDAC / IEEE Design Automation Conference (DAC) - 50th ACM / EDAC / IEEE Design Automation Conference (DAC), États-Unis (2013) [hal-00975424 - version 1]
Fault modeling and diagnosis for nanometric analog circuits
Huang K. et al
Dans IEEE International Test Conference (ITC'13) - IEEE International Test Conference (ITC'13), États-Unis (2013) [hal-00975410 - version 1]
True Non-Intrusive Sensors for RF Built-In Test
Abdallah L. et al
Dans IEEE International Test Conference (ITC'13) - IEEE International Test Conference (ITC'13), États-Unis (2013) [hal-00975407 - version 1]
Optimization of a self-converging algorithm at assembly level to improve SEU Fault-Tolerance
Marques C.A. et al
Dans 4th Latin American Symposium on Circuits And Systems (LASCAS) - 4th Latin American Symposium on Circuits And Systems (LASCAS), Pérou (2013) [hal-00973535 - version 1]
Fault-tolerance capabilities of a software-implemented Hopfield Neural Network
Mansour W. et al
Dans 3rd International Conference on Communications and Information Technology (ICCIT 2013) - 3rd International Conference on Communications and Information Technology (ICCIT 2013), Liban (2013) [hal-00973523 - version 1]
Novel Auto-Adaptative Integration-Time Technique for CMOS Image Sensor
Abbas H. et al
Dans International Image Sensor Workshop (IISW'13) - International Image Sensor Workshop (IISW'13), États-Unis (2013) [hal-00968837 - version 1]
A CMOS HDR Imager with an Analog Local Adaptation
Sicard G. et al
In International Image Sensor Workshop (IISW'13) - International Image Sensor Workshop (IISW'13), United States (2013) [hal-00968779 - version 1]