284 articles – 2152 Notices  [english version]
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fulltext access Self-timed rings as low-phase noise programmable oscillators
Fesquet L. et al
Dans Proceedings of the 12th IEEE International New Circuits and Systems Conference - The 12th IEEE International New Circuits and Systems Conference (NEWCAS 2014), Canada (2014) [ujm-01011287 - version 1]
On error models for RTL security evaluations
Vanhauwaert P. et al
Dans 9th Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS) 2014 - 9th Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS) 2014, Grèce (2014) [hal-01010314 - version 1]
A multiple fault injection methodology based on cone partitioning towards RTL modeling of laser attacks
Papadimitriou A. et al
In Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014 - Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014, Germany (2014) [hal-00981848 - version 1]
SEU fault-injection at system level: method, tools and preliminary results
Mansour W. et al
Dans Latin American Test Workshop (LATW) - Latin American Test Workshop (LATW), Brésil (2014) [hal-01061310 - version 1]
First experimentations of microsensors microfabricated on a long and thin medical needle
Bonvilain A. et al
Dans Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP 14) - Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP 14), France (2014) [hal-01061291 - version 1]
Electromagnetic attacks on embedded devices: a model of probe-circuit power coupling
Alberto D. et al
Dans 9th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - 9th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS), Grèce (2014) [hal-01061232 - version 1]
IDSM: an improved disjoint signature monitoring scheme for processor behavioral checking
Bergaoui S. et al
Dans 15th Latin-American Test Workshop (LATW) - 15th Latin-American Test Workshop (LATW), Brésil (2014) [hal-01061140 - version 1]
Trends in Nanoelectronic Education: From FDSOI and FinFET Technologies to Circuit Design Specifications
Bonnaud O. et al
Dans The 10th European Workshop on Microelectronics Education (EWME 2014) - The 10th European Workshop on Microelectronics Education (EWME 2014), Estonie (2014) [hal-01061123 - version 1]
An asynchronous CMOS probabilistic computer Idea
Faix M. et al
Dans 20th International Symposium on Asynchronous Circuits and Systems (ASYNC), Fresh Idea Session - 20th International Symposium on Asynchronous Circuits and Systems (ASYNC), Fresh Idea Session, Allemagne (2014) [hal-01061108 - version 1]
Low data rate architecture for smart image sensor
Darwish A. et al
Dans Image Sensors and Imaging Systems - Image Sensors and Imaging Systems, États-Unis (2014) [hal-01060442 - version 1]
One-shot calibration of RF circuits based on non-intrusive sensors
Andraud M. et al
Dans Design Automation Conference - Design Automation Conference, États-Unis (2014) [hal-01060268 - version 1]
Efficient Monte Carlo-Based Analog Parametric Fault Modelling
Stratigopoulos H. et al
Dans IEEE VLSI Test Symposium - IEEE VLSI Test Symposium, États-Unis (2014) [hal-01060258 - version 1]
Evidence of the robustness of a COTS Soft-Error Free SRAM to neutron radiation
Velazco R. et al
In Proc. of Nuclear and Space Radiation Effects Conference (NSREC2014) - Nuclear and Space Radiation Effects Conference (NSREC2014), France (2014) [in2p3-01038067 - version 1]
Accelerator-based neutron irradiation of integrated circuits at GENEPI2 (France)
Villa F. et al
In Proc. of Nuclear and Space Radiation Effects Conference (NSREC2014) - Nuclear and Space Radiation Effects Conference (NSREC2014), France (2014) [in2p3-01038056 - version 1]
Scalability bottlenecks discovery in MPSoC platforms using data mining on simulation traces
Lagraa S. et al
Design, Automation & Test in Europe Conference & Exhibition (DATE), Allemagne (2014) [hal-01002685 - version 1]
Characterization and post simulation of thin-film PZT actuated plates for haptic applications
Casset F. et al
In Proceedings of 15th IEEE International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2014 - 15th IEEE International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2014, Belgium (2014) [hal-00992630 - version 1]
fulltext access New techniques for selecting test frequencies for linear analog circuits
Bentobache M. et al
Dans International Conference on Very Large Scale Integration (VLSI-SoC) - International Conference on Very Large Scale Integration (VLSI-SoC), Turquie (2013) [hal-00855154 - version 1]
FlexOE: A Congestion-Aware Routing Algorithm for NoCs
Alcantara De Lima O. et al
In IEEE International Symposium on Rapid System Prototyping - IEEE International Symposium on Rapid System Prototyping, Canada (2013) [ujm-00870338 - version 1]
A single built-in sensor to check pull-up and pull-down CMOS networks against transient faults
Possamai Bastos R. et al
PATMOS'13: 23rd International Workshop on Power and Timing Modeling, Potimization and Simulation, Allemagne (2013) [lirmm-00968621 - version 1]
Adaptive NoC-based system for spectral imaging algorithm to art authentication
Fresse V. et al
In spectral imaging, adaptive architecture, real time system, MPSoC, NoC, performance exploration - 21st European Signal Processing Conference Eusipco, Morocco (2013) [ujm-00857991 - version 1]