248 articles – 2008 Notices  [english version]
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Soft-error-rate prediction for programmable circuits: methodology, tools and studied cases
Velazco R.
In Proc of Conférence magistrale in Congreso Internacional de Ingenieria Eléctrica, Electrónica, Sistemas y Ramas Afines (XVIII INTERCON) - Conférence magistrale in Congreso Internacional de Ingenieria Eléctrica, Electrónica, Sistemas y Ramas Afines (XVIII INTERCON), Peru (2011) [hal-00674531 - version 1]
Performance de Computadoras SIMD Implementadas en FPGAs
Sanchez E. et al
In Proc. of XVII IBERCHIP workshop - XVII IBERCHIP workshop, Colombia (2011) [hal-00673077 - version 1]
Non-Intrusive Reconfigurable HW/SW Fault Tolerance Approach to Detect Transient Faults in Microprocessor Systems
Azambuja J.R. et al
In Proc. of 12th European Conference on Radiation and its Effects on Components and Systems (RADECS'11) - 12th European Conference on Radiation and its Effects on Components and Systems (RADECS'11), Spain (2011) [hal-00673067 - version 1]
On Replacing an RF Test with an Alternative Measurement: Theory and a Case Study
Spyronasios A. et al
In Proc. of IEEE Asian Test Symposium (ATS'11) - IEEE Asian Test Symposium (ATS'11), India (2011) [hal-00672554 - version 1]
A SystemC AMS/TLM platform for CMOS video sensors
Cenni F. et al
In Proc. of IEEE Conference on Design and Architectures for Signal and Image Processing (DASIP'11) - IEEE Conference on Design and Architectures for Signal and Image Processing (DASIP'11), Finland (2011) [hal-00672542 - version 1]
On Proving the Efficiency of Alternative RF Tests
Kupp N. et al
In Proc. of IEEE/ACM International Conference on Computer-Aided Design (ICCAD'11) - IEEE/ACM International Conference on Computer-Aided Design (ICCAD'11), United States (2011) [hal-00672537 - version 1]
Data-aided timing estimation in UWB communication systems using dirty templates
Alhakim R. et al
In Proc. of IEEE International Conference on Ultra Wideband (ICUWB'11) - IEEE International Conference on Ultra Wideband (ICUWB'11, Italy (2011) [hal-00672532 - version 1]
A new fault injection approach to study the impact of bitflips in the configuration of SRAM-based FPGAs
Ziade H. et al
International Arab Journal of Information Technology (IAJIT) 8, 2 (2011) 155-162 [hal-00672465 - version 1]
An Optimal Implementation on FPGA of a Hopfield Neural Network
Mansour W. et al
Advances in Artificial Neural Systems (2011) Article ID 189368 [hal-00672442 - version 1]
Reliability Limits of TMR Implemented in a SRAM-based FPGA: Heavy Ion Measures vs. Fault Injection Predictions
Foucard G. et al
Journal of Electronic Testing: Theory and Application 27, 5, October (2011) pp [hal-00672434 - version 1]
In Flight SEU/MCU Sensitivity of Commercial Nanometric SRAMs: Operational Estimations
Artola L. et al
IEEE Transactions on Nuclear Science 58, 6 (2011) 2644 - 2651 [hal-00672424 - version 1]
RF Front-End Test Using Built-in Sensors
Abdallah L. et al
IEEE Design and Test of Computers 28, 6 (2011) 76-84 [hal-00672386 - version 1]
Inclusion of Power Consumption Information in High-Level Modeling of Linear Analog Blocks
Bousquet L. et al
Journal of Low Power Electronics 7, 4 (2011) 541-551 [hal-00672380 - version 1]
Cramer-Rao lower bounds and maximum likelihood timing synchronization for dirty template UWB communications
Alhakim R. et al
Signal Image and Video Processing Journal published on line 13 October 2011 (2011) pp [hal-00672367 - version 1]
40nm CMOS 0.35V-Optimized Standard Cell Libraries for Ultra-Low Power Applications
Abouzeid F. et al
Transactions on Design Automation of Electronic Systems 16, 3 (2011) article 35 [hal-00672355 - version 1]
Numerical and analytical modelling of holed MEMS resonators
Civet Y. et al
Sensors and Actuators A: Physical (2011) 6 p. [hal-00671984 - version 1]
Internal model control for a self-tuning Delay-Locked Loop in UWB communication systems
Alhakim R. et al
In Proc. of 17th IEEE International On-Line Testing Symposium (IOLT'11) - 17th IEEE International On-Line Testing Symposium (IOLT'11), Greece (2011) [hal-00671516 - version 1]
Fast Memory Consistency Analysis using Non-Intrusive Simulation Traces
Hedde D. et al
In Proc. of The 2011 System, Software, SoC and Silicon Debug Conference (S4D) - The 2011 System, Software, SoC and Silicon Debug Conference (S4D), Germany (2011) [hal-00671512 - version 1]
A Non-Intrusive Simulation-Based Trace System for Fine-Grain Analysis of Multiprocessor Systems-on Chips Software
Hedde D. et al
In Proc. of The 2011 System, Software, SoC and Silicon Debug Conference (S4D) - The 2011 System, Software, SoC and Silicon Debug Conference (S4D), United Kingdom (2011) [hal-00671503 - version 1]
A Fault-Tolerant Deadlock-Free Adaptive Routing for On Chip Interconnects
Chaix F. et al
In Proc. of Design Automation and Test in Europe Conference (DATE'11) - Design Automation and Test in Europe Conference (DATE'11), France (2011) [hal-00671500 - version 1]