282 articles – 2123 Notices  [english version]
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Evaluating a low cost robustness improvement in SRAM-based FPGAs
Ben Jrad M. et al
In Proceedings of 18th IEEE International On-Line Testing symposium (IOLTS'13) - 18th IEEE International On-Line Testing symposium (IOLTS'13), France (2013) [hal-00872826 - version 1]
Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection
Dutertre J.-M. et al
In Proceedings of 24th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF'13 - 24th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF'13), France (2013) [hal-00872705 - version 1]
A Single Built-in Sensor to Check Pull-up and Pull-down CMOS Networks against Transient Faults
Possamai Bastos R. et al
In Proceedings of the International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS) - The International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS), Germany (2013) [hal-00872693 - version 1]
A Bulk Built-in Sensor for Detection of Fault Attacks
Possamai Bastos R. et al
In Proc. of IEEE International Symposium on Hardware Oriented Security and Trust (HOST'13) - IEEE International Symposium on Hardware Oriented Security and Trust (HOST'13), United States (2013) [hal-00871009 - version 1]
Innovating projects as a pedagogical strategy for the French network for education in microelectronics and nanotechnologies
Bonnaud O. et al
In Proceedings of International Conference on Microelectronic Systems Education (MSE 2013) - International Conference on Microelectronic Systems Education (MSE 2013), United States (2013) [hal-00862833 - version 1]
Empirical recovery of input nonlinearity in distributed element models
Sliwinski P. et al
In Proceedings of 11th IFAC International Workshop on Adaptation and Learning in Control and Signal Processing (ALCOSP) - 11th IFAC International Workshop on Adaptation and Learning in Control and Signal Processing (ALCOSP), France (2013) [hal-00862807 - version 1]
On improving at no cost the quality of products built with SRAM-based FPGAs
Leveugle R. et al
In Proceedings of 5th Asia Symposium on Quality Electronic Design (ASQED 2013) - 5th Asia Symposium on Quality Electronic Design (ASQED 2013), Malaysia (2013) [hal-00862792 - version 1]
An evaluation of an AES implementation protected against EM analysis
Maistri P. et al
In Proceedings of 23rd ACM international conference on Great lakes symposium on VLSI (GLSVLSI'13) - 23rd ACM international conference on Great lakes symposium on VLSI (GLSVLSI'13), France (2013) [hal-00862787 - version 1]
Investigation of Electromagnetic Fault Injection Effects on Embedded Cryptosystems
Alberto D. et al
In Proceedings of First Workshop on Trustworthy Manufacturing and Utilization of Secure Devices (TRUDEVICE 2013) - First Workshop on Trustworthy Manufacturing and Utilization of Secure Devices (TRUDEVICE 2013), France (2013) [hal-00862773 - version 1]
Hot topic session 4A: Reliability analysis of complex digital systems
Evans A. et al
In Proc. of IEEE 31st VLSI Test Symposium (VTS'13) - IEEE 31st VLSI Test Symposium (VTS'13), United States (2013) [hal-00842825 - version 1]
ADDA: Adaptive Double-sampling Architecture for Highly Flexible Robust Design
Nicolaidis M.
In Proc. of Design Automation and Test in Europe Conference (DATE) - Design Automation and Test in Europe Conference (DATE), Grenoble, France (2013) [hal-00842818 - version 1]
Towards a Hierarchical and Scalable Approach for Modeling the Effects of SETs
Costenaro E. et al
In Proc. of IEEE Workshop on Silicon Errors in Logic - System Effects (SELSE) - IEEE Workshop on Silicon Errors in Logic - System Effects (SELSE), United States (2013) [hal-00842816 - version 1]
Iterative Diagnosis for ECC-based Memory Repair
Papavramidou P. et al
In Proc. of IEEE VLSI Test Symposium (VTS) - IEEE VLSI Test Symposium (VTS), United States (2013) [hal-00842320 - version 1]
Reducing Power Dissipation in Memory Repair for High Defect Densities
Papavramidou P. et al
In Proc. of 18th IEEE European Test Symposium (ETS'13) - 18th IEEE European Test Symposium (ETS'13), Avignon, France, May 27-31, France (2013) [hal-00842251 - version 1]
Variability-Aware and Fault-tolerant Self-Adaptive applications for Many-Core chips
Bizot G. et al
In 18TH IEEE European Test Symposium (ETS), Avignon, France, May 27th - 30th - 18TH IEEE European Test Symposium (ETS), France (2013) [hal-00842246 - version 1]
Statistical Modelling of Analog Circuits for Test Metrics Computation
Beznia K. et al
In Proc. of 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS), United Arab Emirates (2013) [hal-00842240 - version 1]
Multivariate Statistical Techniques for Analog Parametric Test Metrics Estimation
Huang K. et al
In 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS), Abu Dhabi, UAE, March 26-28 - 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS), Abu Dhabi, UAE, March 26-28, United Arab Emirates (2013) [hal-00842238 - version 1]
Statistical Static Timing Analysis of Conditional Asynchronous Circuits Using Model-Based Simulation
Yahya E. et al
In Proc. of 19th International Symposium on Asynchronous Circuits and Systems (ASYNC) - 19th International Symposium on Asynchronous Circuits and Systems (ASYNC), United States (2013) [hal-00842226 - version 1]
Non-uniform sampling pattern recognition based on atomic decomposition
Le Pelleter T. et al
In Proc. of 10th International Conference on Sampling Theory and Applications (SampTA 2013) - 10th International Conference on Sampling Theory and Applications (SampTA 2013), Germany (2013) [hal-00842215 - version 1]
From System Model Formalization Towards Correct and Efficient HW/SW Design
Jaber M. et al
In 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS), , UAE, March 26-28, United Arab Emirates (2013) [hal-00841753 - version 1]