248 articles – 2008 Notices  [english version]
.:. Consultation > Liste par auteurs > Ammari .:.
10 documents classés par :
SET fault injection methods in analog circuits: case study
Ammari A. et al
Dans 8th Latin-American Test Workshop (LATW'07) - 8th Latin-American Test Workshop (LATW'07), France (2007) [hal-00156749 - version 1]
Experimental Evaluation of Protections Against Laser-induced Faults and Consequences on Fault Modeling
Leveugle R. et al
Dans Design, Automation & Test in Europe Conference & Exhibition (DATE '07) - Design, Automation & Test in Europe Conference & Exhibition (DATE '07), France (2007) [hal-00156590 - version 1]
fulltext access ANALYSE DE SÛRETE DES CIRCUITS COMPLEXES DECRITS EN LANGAGE DE HAUT NIVEAU
Ammari A.
Institut National Polytechnique de Grenoble - INPG (31/08/2006), LEVEUGLE, R. (Dir.) [tel-00101622 - version 1]
Evaluation of a software-based error detection technique by RT-level fault injection
Ammari A. et al
Dans Proceedings - 3rd IEEE International Workshop on Electronic Design, Test & Applications (DELTA'06) - 3rd IEEE International Workshop on Electronic Design, Test & Applications (DELTA'06), France (2006) [hal-00143462 - version 1]
Injection of multiple bit-flips for counter measures validation
HADJIAT K. et al
Dans 2nd International Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC'05), Edinburg, UK, September 2 - (2005) [hal-00105576 - version 1]
Combined Fault Classification and Error Propagation Analysis to Refine RT-Level Dependability Evaluation
Ammari A. et al
Journal of Electronic Testing: Theory and Application Volume 21, Number 4 (2005) 365 - 376 [hal-00083083 - version 1]
Early SEU fault injection in digital, analog and mixed signal circuits: a global flow
Leveugle R. et al
Dans Proceedings.-Design,-Automation-and-Test-in-Europe-Conference-and-Exhibition - Proceedings.-Design,-Automation-and-Test-in-Europe-Conference-and-Exhibition, France (2004) [hal-00015036 - version 1]
On combining fault classification and error propagation analysis in RT-Level dependability evaluation
Ammari A. et al
Dans Proceedings.-10th-IEEE-International-On-Line-Testing-Symposium - Proceedings.-10th-IEEE-International-On-Line-Testing-Symposium, Portugal (2004) [hal-00015035 - version 1]
System-level dependability analysis with RT-level fault injection accuracy
Leveugle R. et al
Dans Proceedings.-19th-IEEE-International-Symposium-on-Defect-and-Fault-Tolerance-in-VLSI-Systems - Proceedings.-19th-IEEE-International-Symposium-on-Defect-and-Fault-Tolerance-in-VLSI-Systems, France (2004) [hal-00015012 - version 1]
Detailed comparison of dependability analyses performed at RT and gate levels
Ammari A. et al
Dans Proceedings.-18th-IEEE-International-Symposium-on-Defect-and-Fault-Tolerance-in-VLSI-Systems - Proceedings.-18th-IEEE-International-Symposium-on-Defect-and-Fault-Tolerance-in-VLSI-Systems, États-Unis (2003) [hal-00015040 - version 1]