282 articles – 2123 references  [version française]
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11 documents ordered by :

fulltext access Contribution à la vérification des circuits intégrés dans un environnement multivalué
Caisso J.-P.
Institut National Polytechnique de Grenoble - INPG (16/11/1987), Bernard Courtois (Dir.) [tel-00325819 - version 1]
The FELIN arithmetic coprocessor chip
Cosnard M. et al
Dans Proceedings-of-the-8th-Symposium-on-Computer-Arithmetic-Cat.-No.87CH2419-0 - Proceedings-of-the-8th-Symposium-on-Computer-Arithmetic-Cat.-No.87CH2419-0, Italie (1987) [hal-00014979 - version 1]
A way to build efficient carry-skip adders
Guyot A. et al
IEEE Transactions on Computers Oct. ; C-36(10) (1987) 1144-52 [hal-00014976 - version 1]
Evaluation of a self-checking version of the MC 68000 microprocessor
Nicolaidis M.
Microprocessing-&-Microprogramming May ; 20(4-5) (1987) 235-47 [hal-00014084 - version 1]
Shorts in self-checking circuits
Nicolaidis M.
Dans International-Test-Conference-1987-Proceedings:-Integration-of-Test-with-Design-and-Manufacturing-Cat.-No.87CH2347-2 - International-Test-Conference-1987-Proceedings:-Integration-of-Test-with-Design-and-Manufacturing-Cat.-No.87CH2347-2, France (1987) [hal-00014077 - version 1]
Design of a self-checking microprocessor for real-time applications
Osseiran A. et al
Dans Control-in-Transportation-Systems-1986.-Proceedings-of-the-5th-IFAC/IFIP/IFORS-Conference - Control-in-Transportation-Systems-1986.-Proceedings-of-the-5th-IFAC/IFIP/IFORS-Conference, Autriche (1987) [hal-00013426 - version 1]
The SYCO silicon compiler and its environment
Jerraya A.A. et al
Dans Design-Systems-for-VLSI-Circuits.-Logic-Synthesis-and-Silicon-Compilation.-Proceedings-of-the-NATO-Advanced-Study-Institute - Design-Systems-for-VLSI-Circuits.-Logic-Synthesis-and-Silicon-Compilation.-Proceedings-of-the-NATO-Advanced-Study-Institute, Italie (1987) [hal-00013423 - version 1]
Automatic failure of analysis of VLSI circuits using E-beam
Savart D. et al
Microelectronic Engineering 7(2-4) (1987) 259-66 [hal-00013418 - version 1]
An integrated debugging system based on E-beam test
Guiguet I. et al
Microelectronic Engineering 7(2-4) (1987) 275-82 [hal-00013414 - version 1]
Design methods of electron beam sensitive devices in NMOS and CMOS technologies
Micollet D. et al
Microelectronic Engineering 7(2-4) (1987) 419-26 [hal-00013409 - version 1]
A history of research in fault tolerant computing at the Grenoble University
David R. et al
Dans Evolution-of-Fault-Tolerant-Computing.-In-the-Honor-of-William-C.-Carter - Evolution-of-Fault-Tolerant-Computing.-In-the-Honor-of-William-C.-Carter, Autriche (1987) [hal-00013405 - version 1]