279 articles – 2093 references  [version française]
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Digital circuits specification language
Borrione D.
In Computer-Applications-in-Production-and-Engineering-CAPE-'86.-Preprints-of-the-2nd-International-Conference. - Computer-Applications-in-Production-and-Engineering-CAPE-'86.-Preprints-of-the-2nd-International-Conference., Denmark (1986) [hal-00014310 - version 1]
Self-checking circuits: from theory to practice
Nicolaidis M. et al
In Safety-of-Computer-Control-Systems-1986-SAFECOMP-'86.-Trends-in-Safe-Real-Time-Computer-Systems.-Proceedings-of-the-Fifth-IFAC-Workshop. - Safety-of-Computer-Control-Systems-1986-SAFECOMP-'86.-Trends-in-Safe-Real-Time-Computer-Systems.-Proceedings-of-the-Fifth-IFAC-Workshop., France (1986) [hal-00014086 - version 1]
A unified built in self-test scheme: UBIST
Nicolaidis M.
In ESSCIRC-'86.-Twelfth-European-Solid-State-Circuits-Conference. - ESSCIRC-'86.-Twelfth-European-Solid-State-Circuits-Conference., Netherlands (1986) [hal-00014085 - version 1]
Design of NMOS strongly fault secure circuits using unidirectional errors detecting codes
Nicolaidis M. et al
In FTCS-Digest-of-Papers.-16th-Annual-International-Symposium-on-Fault-Tolerant-Computing-Systems-Cat.-No.86CH2335-8 - FTCS-Digest-of-Papers.-16th-Annual-International-Symposium-on-Fault-Tolerant-Computing-Systems-Cat.-No.86CH2335-8, Austria (1986) [hal-00013449 - version 1]
Random testing versus deterministic testing of RAMs
Fuentes A. et al
In FTCS-Digest-of-Papers.-16th-Annual-International-Symposium-on-Fault-Tolerant-Computing-Systems-Cat.-No.86CH2335-8 - FTCS-Digest-of-Papers.-16th-Annual-International-Symposium-on-Fault-Tolerant-Computing-Systems-Cat.-No.86CH2335-8, Austria (1986) [hal-00013446 - version 1]
Towards automatic failure analysis of complex ICs through e-beam testing
Bergher L. et al
In International-Test-Conference-1986-Proceedings.-Testing's-Impact-on-Design-and-Technology-Cat.-No.-86CH2339-0. - International-Test-Conference-1986-Proceedings.-Testing's-Impact-on-Design-and-Technology-Cat.-No.-86CH2339-0., United States (1986) [hal-00013436 - version 1]
Electron beam observability and controllability for the debugging of integrated circuits
Guiguet I. et al
In ESSCIRC-'86.-Twelfth-European-Solid-State-Circuits-Conference - ESSCIRC-'86.-Twelfth-European-Solid-State-Circuits-Conference, Netherlands (1986) [hal-00013433 - version 1]
Advances in fault modelling and test pattern generation for CMOS
Baschiera D. et al
In Proceedings-of-the-IEEE-International-Conference-on-Computer-Design:-VLSI-in-Computers.-ICCD-'86-Cat.-No.86CH2348-1 - Proceedings-of-the-IEEE-International-Conference-on-Computer-Design:-VLSI-in-Computers.-ICCD-'86-Cat.-No.86CH2348-1, United States (1986) [hal-00013430 - version 1]
Test and diagnosis problems in VLSI; experiences on microprocessor test and diagnosis
Velazco R.
In Microcomputer '86 - Design, Practice, Education - Microcomputer '86 - Design, Practice, Education, Poland (1986) [hal-00013339 - version 1]
Principles of the SYCO compiler
Jerraya A.A. et al
In Annual ACM IEEE Design Automation Conference - (1986) [hal-00007753 - version 1]