248 articles – 2008 references  [version française]
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TPDL: a Temporal Profile Description Language
Borrione D. et al
Workshop on Hardware Design Verification, Germany (1984) [hal-00382896 - version 1]
Design of self-checking N-MOS (H-MOS) integrated circuits
Nicolaidis M. et al
In AGARD-Conference-Proceedings-No.-361.-Design-for-Tactical-Avionics-Maintainability-AGARD-CP-361. - AGARD-Conference-Proceedings-No.-361.-Design-for-Tactical-Avionics-Maintainability-AGARD-CP-361., Belgium (1984) [hal-00014142 - version 1]
Methodology for the use of an electron-beam tester of integrated circuits
Courtois B.
In 1984-IEEE-International-Symposium-on-Circuits-and-Systems.-Proceedings-Cat.-No.-84CH1993-5. - 1984-IEEE-International-Symposium-on-Circuits-and-Systems.-Proceedings-Cat.-No.-84CH1993-5., Canada (1984) [hal-00013484 - version 1]
Strongly code disjoint checkers
Nicolaidis M. et al
In Fourteenth-International-Conference-on-Fault-Tolerant-Computing.-Digest-of-Papers-Cat.-No.-84CH2050-3. - Fourteenth-International-Conference-on-Fault-Tolerant-Computing.-Digest-of-Papers-Cat.-No.-84CH2050-3., United States (1984) [hal-00013474 - version 1]
Testing CMOS: a challenge
Baschiera D. et al
VLSI Design Oct. ; 5(10) (1984) 58-62 [hal-00013473 - version 1]
Design of self-checking N-MOS (H-MOS) integrated circuits
Courtois B. et al
In AGARD-Conference-Proceedings-No.-361.-Design-for-Tactical-Avionics-Maintainability-AGARD-CP-361. Oct. - AGARD-Conference-Proceedings-No.-361.-Design-for-Tactical-Avionics-Maintainability-AGARD-CP-361. Oct., Belgium (1984) [hal-00013472 - version 1]
Functional testing vs. structural testing of RAMS
Sahami H. et al
In Fault-Tolerant-Computing-Systems.-2nd-GI/NTG/GMR-Conference. - Fault-Tolerant-Computing-Systems.-2nd-GI/NTG/GMR-Conference., Germany (1984) [hal-00013470 - version 1]
Test pattern generation with respect to fault modelling
Courtois B.
In Advances-in-Microprocessing-and-Microprogramming.-Tenth-EUROMICRO-Symposium-on-Microprocessing-and-Microprogramming. - Advances-in-Microprocessing-and-Microprogramming.-Tenth-EUROMICRO-Symposium-on-Microprocessing-and-Microprogramming., Denmark (1984) [hal-00013466 - version 1]
Design of SCD checkers based on analytical fault hypotheses
Jansch I. et al
In ESSCIRC-'84.-Tenth-European-Solid-State-Circuits-Conference - ESSCIRC-'84.-Tenth-European-Solid-State-Circuits-Conference, United Kingdom (1984) [hal-00013460 - version 1]
Advances in test pattern generation for integrated circuits
Courtois B.
In Proceedings-of-Automatic-Testing-and-Test-Instrumentation-'84 - Proceedings-of-Automatic-Testing-and-Test-Instrumentation-'84, France (1984) [hal-00013455 - version 1]
Automatic generation of microprocessor test programs
Bellon C. et al
In ACM-IEEE-Nineteenth-Design-Automation-Conference-Proceedings - ACM-IEEE-Nineteenth-Design-Automation-Conference-Proceedings, United States (1984) [hal-00013362 - version 1]
A behavioural test method for microprocessors and complex circuits
Bellon C. et al
In European-Conference-on-Electronic-Design-Automation-EDA-84. - European-Conference-on-Electronic-Design-Automation-EDA-84., United Kingdom (1984) [hal-00013359 - version 1]
Taking into account asynchronous signals in functional test of complex circuits
Bellon C. et al
In ACM-IEEE-21st-Design-Automation-Conference-Proceedings-84-cat.-no.-84CH2049-5. - ACM-IEEE-21st-Design-Automation-Conference-Proceedings-84-cat.-no.-84CH2049-5., United States (1984) [hal-00013356 - version 1]
Hardware and software tools for microprocessor functional test
Bellon C. et al
In International-Test-Conference-1984-Proceedings-Cat.-No.-84CH2084-2 - International-Test-Conference-1984-Proceedings-Cat.-No.-84CH2084-2, United States (1984) [hal-00013352 - version 1]