279 articles – 2093 references  [version française]
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IEEE Asian Test Symposium (ATS'11), New Delhi : Inde (2011)
On Replacing an RF Test with an Alternative Measurement: Theory and a Case Study
A. Spyronasios1, L. Abdallah2, H. Stratigopoulos2, S. Mir2

In this paper we present the theory for evaluating the test error that we commit when we replace a standard analog test by a lower-cost alternative measurement. The evaluation takes place during the design and test development phases and relies on a tractable number of simulations. The test error is expressed in terms of test escape and yield loss which are estimated in parts per million accuracy. The theory is demonstrated with an example. In particular, we evaluate whether a dedicated on-chip envelope detector can be used to eliminate the NF test for an LNA.
1:  Department of Electrical & Computer Engineering - Aristotle University of Thessaloniki
2:  TIMA - Techniques of Informatics and Microelectronics for integrated systems Architecture
Integrated Circuits – Monte-Carlo-method