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Article in peer-reviewed journal

IEEE Design and Test of Computers 28, 6 (2011) 76-84

RF Front-End Test Using Built-in Sensors

L. Abdallah1, H. Stratigopoulos1, S. Mir1, C. Kelma2

This article proposes a new class of sensors for built-in test in RF devices. These sensors are placed in close proximity to the DUT on the same substrate without being electrically connected to it. Instead, they monitor it by virtue of being subjected to the same process variations. The authors also describe other types of sensors they have studied, including DC probes, an envelope detector, and a current sensor.

1:	TIMA - Techniques of Informatics and Microelectronics for integrated systems Architecture
2:	NXP Semiconductors

Keyword(s) : built-in self test – integrated-circuit-testing

hal-00672386, version 1

http://hal.archives-ouvertes.fr/hal-00672386

oai:hal.archives-ouvertes.fr:hal-00672386

From: Lucie Torella <>

Submitted on: Tuesday, 21 February 2012 10:55:06

Updated on: Tuesday, 21 February 2012 10:55:06