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European Test Symposium (ETS'09), Sevilla, Spain, May 25-29, Sevilla : Spain (2009)

Defect filter for alternate RF test

H. Stratigopoulos1, S. Mir1, E. Acar2, S. Ozev3

Alternate RF testing is a very promising candidate for replacing the costly standard specification-based approach. The defect filter in the alternate test flow is a crucial preparatory step for the overall success of alternate test. In this paper, we present a novel nonlinear defect filter based on an estimate of the joint probability density function of the alternate measurements. The construction of the filter does not require a defect dictionary and can accommodate any underlying density without needing any prior knowledge regarding its parametric form.

1:	TIMA - Techniques of Informatics and Microelectronics for integrated systems Architecture
2:	Duke ECE - Department of Electrical and Computer Engineering
3:	Electrical Engineering Dept., Tempe

Keyword(s) : RF-applications

hal-00418402, version 1

http://hal.archives-ouvertes.fr/hal-00418402

oai:hal.archives-ouvertes.fr:hal-00418402

From: Lucie Torella <>

Submitted on: Friday, 18 September 2009 14:00:22

Updated on: Friday, 18 September 2009 14:00:22