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Article in peer-reviewed journal

IFIP-Transactions-A-Computer-Science-and-Technology A-42 (1994) 123-32

Test of single fault tolerant controllers in VLSI circuits

R. Leveugle1, 2

Specific test problems have to be solved in the case of circuits with fault tolerance capabilities. This paper addresses the off-line test of single fault tolerant controllers embedded in VLSI circuits. After a brief presentation of the controller architectures, an approach is proposed to solve the test problems using simple built-in devices. A failure mode analysis demonstrates that this approach is efficient and appropriate to the application field.

1:	TIMA - Techniques of Informatics and Microelectronics for integrated systems Architecture
2:	CSI - CSI, INPG, Grenoble

Keyword(s) : single-fault-tolerant-controllers – VLSI-circuits – test-problems – off-line-test – controller-architectures – built-in-devices – failure-mode-analysis

hal-00015217, version 1

http://hal.archives-ouvertes.fr/hal-00015217

oai:hal.archives-ouvertes.fr:hal-00015217

From: Lucie Torella <>

Submitted on: Monday, 5 December 2005 14:27:04

Updated on: Monday, 5 December 2005 14:27:04