| Author(s) |
A. Wahba1, D. Borrione2 |
| Laboratory |
|
| Subject |
Engineering Sciences/Micro and nanotechnologies/Microelectronics
|
| Title |
Automatic diagnosis may replace simulation for correcting simple design errors |
| Abstract |
An automated tool for diagnosing simple design errors in VHDL description is presented. The tool is tested on benchmark circuits, and the results show that the error is localized precisely, after the application of a small number of specially generated test patterns. This tool is now integrated within the PREVAIL/sup TM/ system, and is being tested on industrial circuits. |
| Fulltext language |
English |
|
| DOI |
10.1109/EURDAC.1996.558246 |
| Book title |
Proceedings-EURO-DAC-'96.-European-Design-Automation-Conference-with-EURO-VHDL-'96-and-Exhibition-Cat.-No.96CB36000 |
| Publication date |
1996 |
| Page, identifiant, ... |
476-81 |
| Commercial editor |
IEEE Comput. Soc. Press, Los Alamitos, CA, USA |
|
| Conference or book title |
Proceedings-EURO-DAC-'96.-European-Design-Automation-Conference-with-EURO-VHDL-'96-and-Exhibition-Cat.-No.96CB36000 |
| Conference date |
1996 |
| City |
Geneva |
| Country |
Switzerland |
|
| Keyword(s) |
automatic-diagnosis – simple-design-error-correction – VHDL-description – benchmark-circuits – specially-generated-test-patterns – industrial-circuits – combinational-circuits – sequential-circuits – test-pattern-generation |
| Classification |
PACS 85.42 |
| Comment |
ISBN: 081867573X |
|
