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TIMA Laboratory | Publications |  |
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TIMA Laboratory | Publications | |
| Detailed view | Article in peer-reviewed journal |
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| VLSI Design Oct. ; 5(10) (1984) 58-62 |
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| Testing CMOS: a challenge |
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| D. Baschiera1B. Courtois1 |
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| CMOS technology poses a multi-faceted challenge in testing. Since 1978, researchers have recognized that the stuck-open transistor fault requires special test procedures. Other faults, such as transistors stuck-on or shorted, likewise involve complications. However, these fault types have received comparatively little attention. This article reviews results on the testing of stuck-open faults, develops procedures for testing stuck-on faults, and discusses problems in testing for short faults. Through this analysis, the authors arrive at recommendations for investigating `design for CMOS testability'. |
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| 1: | TIMA - Techniques of Informatics and Microelectronics for integrated systems Architecture |
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| CMOS- – stuck-open-transistor-fault – test-procedures – fault-types – stuck-on-faults – short-faults – testability- |
| hal-00013473, version 1 | |
| http://hal.archives-ouvertes.fr/hal-00013473 | |
| oai:hal.archives-ouvertes.fr:hal-00013473 | |
| From: Lucie Torella | |
| Submitted on: Tuesday, 8 November 2005 15:35:49 | |
| Updated on: Tuesday, 8 November 2005 15:35:49 | |