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TIMA Laboratory | Publications |  |
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TIMA Laboratory | Publications | |
| Detailed view | Conference proceedings |
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| Proceedings-of-Automatic-Testing-and-Test-Instrumentation-'84, Paris : France (1984) |
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| Advances in test pattern generation for integrated circuits |
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| B. Courtois1 |
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| Testing is becoming a challenge, due to the increase of circuit integration. The author presents a classification according to the life-cycle of integrated circuits and a classification of test pattern generation methods. Advances in structural testing and functional testing are considered. Electron beam testing and design for testability are also described. |
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| 1: | TIMA - Techniques of Informatics and Microelectronics for integrated systems Architecture |
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| electron-beam-testing – IC-testing – automatic-testing – test-pattern-generation – integrated-circuits – classification- – life-cycle |
| hal-00013455, version 1 | |
| http://hal.archives-ouvertes.fr/hal-00013455 | |
| oai:hal.archives-ouvertes.fr:hal-00013455 | |
| From: Lucie Torella | |
| Submitted on: Tuesday, 8 November 2005 14:58:39 | |
| Updated on: Thursday, 23 February 2006 17:30:52 | |