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Conference proceedings

ACM-IEEE-Nineteenth-Design-Automation-Conference-Proceedings, Las Vegas, NV : États-Unis (1984)

Automatic generation of microprocessor test programs

C. Bellon1, R. Velazco1, A. Liothin1, S. Sadier1, G. Saucier1, F. Grillot1, M. Issenman

Presents an automatic generation system for behavioral test programs of microprocessors. First, the test environment is presented, as well as its consequences on test program generation. In the second part, the test principles are outlined; it is a behavioral test, i.e. a test determined from the user's description of the microprocessor; the resulting test programs are quite modular. The third part presents the description language and the generation system.

1:	TIMA - Techniques of Informatics and Microelectronics for integrated systems Architecture

Keyword(s) : ATE- – logic-testing – microprocessor-test-programs – automatic-generation-system – behavioral-test – description-language

hal-00013362, version 1

http://hal.archives-ouvertes.fr/hal-00013362

oai:hal.archives-ouvertes.fr:hal-00013362

From: Lucie Torella <>

Submitted on: Monday, 7 November 2005 16:40:15

Updated on: Monday, 7 November 2005 16:40:15