282 articles – 2123 references  [version française]
Detailed view Article in peer-reviewed journal
Annales-de-Physique Dec. 1989; 14colloq(2) (1989) 357-72
Comparisons of tests using heavy ions from californium and from cyclotron
R. Velazco1, A. Provost-Grellier1

The authors present experimental equipment which allows one to perform heavy ion test on programmable integrated circuits. This equipment is used along with two different means of heavy ion simulator to perform source developed by DERTS-ONERA and the LBL 88" cyclotron. The observed discrepancies between Cf/sup 252/ and cyclotron results cast doubt on the validity of using the californium source to simulate high LET particles.
1:  TIMA - Techniques of Informatics and Microelectronics for integrated systems Architecture
single-event-upset – LBL-cyclotron – LSI- – VLSI- – heavy-ion-test – programmable-integrated-circuits – heavy-ion-simulator – LET-particles – Cf-fission-decay