284 articles – 2152 references  [version française]
Detailed view Article in peer-reviewed journal
Microelectronic-Engineering May 1990; 12(1-4) (1990) 113-120
Top down IC failure analysis using an E-beam system coupled to a functional teste
R. Velazco1, D. Conard1, A. Guyot1, H. Ziade2

A diagnosis system devoted to precise failure analysis of complex ICs has been built up by coupling an E-beam tester, a functional tester and a test program generator. A case study illustrates the approach efficiency and the tools flexibility.
1:  TIMA - Techniques of Informatics and Microelectronics for integrated systems Architecture
2:  FACULTY OF ENGINEERING I - Faculty of Engineering I
top-down-IC-failure-analysis – electron-beam-tester – functional-tester – diagnosis-system – test-program-generator