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Single event upsets on a read only memory based complex programmable logic device Faure F. et al in Proceedings-of-the-7th-European-Conference-on-Radiation-and-its-Effects-on-Components-and-Systems-RADECS-2003- - (2003) - http://hal.archives-ouvertes.fr/hal-00008186

Author(s)	F. Faure1, R. Velazco ()2
Laboratory	1:  IST. DI ASTROFISICA SPAZIALE E FISICA COSMICA - CNR Ist. di Astrofisica Spaziale e Fisica Cosmica Milan Italy 2:  TIMA - Techniques of Informatics and Microelectronics for integrated systems Architecture http://tima.imag.fr/ CNRS : UMR5159 – Université Joseph Fourier - Grenoble I – Institut National Polytechnique de Grenoble (INPG) 46 Av Félix Viallet 38031 GRENOBLE CEDEX 1 France
Subject	Engineering Sciences/Micro and nanotechnologies/Microelectronics
Title	Single event upsets on a read only memory based complex programmable logic device
Abstract	SEU susceptibility of a ROM-based CPLD has been measured. Four different cross-sections for the same flip-flops are reported, putting in evidence the need for carefully planning the test pattern used during evaluation.
Fulltext language	English
Book title	Proceedings-of-the-7th-European-Conference-on-Radiation-and-its-Effects-on-Components-and-Systems-RADECS-2003-
Publication date	2003
Page, identifiant, ...	279-82
Commercial editor	ESA/ESTEC, Noordwijk, Netherlands
Conference date	2003
Keyword(s)	single-event-upsets – read-only-memory-based-complex-programmable-logic-device – SEU-susceptibility – ROM-based-CPLD – flip-flop-cross-sections – test-pattern
Classification	PACS 85.42

hal-00008186, version 1

http://hal.archives-ouvertes.fr/hal-00008186

oai:hal.archives-ouvertes.fr:hal-00008186

From: Lucie Torella <>

Submitted on: Wednesday, 24 August 2005 15:01:55

Updated on: Wednesday, 24 August 2005 15:01:55