285 articles – 2153 references  [version française]
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Accurate Estimation of Analog Test Metrics With Extreme Circuits
Beznia K. et al
In In IEEE International Conference on Electronics, Circuits, and Systems (ICECS) - In IEEE International Conference on Electronics, Circuits, and Systems (ICECS), Spain (2012) [hal-00765175 - version 1]
A Tool for Statistical Modelling by Means of Copulas of Analog and Mixed-Signal Circuits
Bounceur A. et al
In In 27th conference on Design of Circuits and Integrated Systems (DCIS'12) - In 27th conference on Design of Circuits and Integrated Systems (DCIS'12), France (2012) [hal-00765185 - version 1]
Modeling of thin resistive sheets in the Ddscontinuous Galerkin method for shielding evaluation
Boubekeur M. et al
In Proceedings of the 15th Biennial IEEE Conference on Electromagnetic Field Computation - IEEE CEFC 2012, Japan (2012) [hal-00783302 - version 1]
Emulation platform for an adaptive NoC-based MPSoC architecture dedicated to spectral imaging for art authentication
Tan J. et al
In International Conference on Image Processing Theory, Tools and Applications - IPTA 2012 : International Conference on Image Processing Theory, Tools and Applications, Turkey (2012) [ujm-00738494 - version 1]
Case study: deployment of the 2D NoC on 3D for the generation of large emulation platforms.
Fresse V. et al
In IEEE International Symposium on Rapid System Prototyping - IEEE International Symposium on Rapid System Prototyping, Finland (2012) [ujm-00738489 - version 1]
Automatic Congestion Detection in MPSoC Programs Using Data Mining on Simulation Traces
Lagraa S. et al
In Proceedings of the 23rd IEEE International Symposium on Rapid System Prototyping (RSP) - RSP 2012 - International Symposium on Rapid System Prototyping, Finland (2012) [hal-00922890 - version 1]
fulltext access Performance evaluation of centralized maintenance workshop by using Queuing Networks
Simeu-Abazi Z. et al
In AMEST'2012 - Advanced Maintenance Engineering, Services and Technology AMEST' 2012,, Spain (2012) [hal-00787542 - version 1]
Une application efficace du problème de recouvrement au test de circuits analogiques
Bentobache M. et al
In 13e congrès annuel de la Société française de Recherche Opérationnelle et d'Aide à la Décision - ROADEF 2012, France (2012) [hal-00678609 - version 1]
fulltext access Comparison of Self-Timed Ring and Inverter Ring Oscillators as Entropy Sources in FPGAs
Cherkaoui A. et al
In Proceedings of Design Automation and Test in Europe (DATE 2012) - Design Automation and Test in Europe (DATE 2012), Germany (2012) [ujm-00667639 - version 1]
System-level reliability using component-level failure signatures
Wrong R. et al
In International Reliability Physics Symposium (IRPS'12) - International Reliability Physics Symposium (IRPS'12), United States (2012) [hal-01061337 - version 1]
Novel transient-fault detection circuit featuring enhanced bulk built-in current sensor with low-power sleep-mode
Possamai Bastos R. et al
In Proc. of 23rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF) - 23rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Italy (2012) [hal-00867864 - version 1]
Through-Silicon-Via Built-In Self-Repair for Aggressive 3D Integration
Nicolaidis M. et al
In IEEE 18th International On-Line Testing Symposium (IOLTS) - IEEE 18th International On-Line Testing Symposium (IOLTS), Spain (2012) [hal-00841561 - version 1]
A Standards Based Approach to the Reliability Specification of IP Components
Evans A. et al
In IP-SOC Conference - IP-SOC Conference, France (2012) [hal-00840774 - version 1]
Case Study of SEU Effects in a Network Processor
Evans A. et al
In Proc. of IEEE Workshop on Silicon Errors in Logic - System Effects (SELSE) - IEEE Workshop on Silicon Errors in Logic - System Effects (SELSE), United States (2012) [hal-00815995 - version 1]
Test algorithms for ECC-based memory repair in nanotechnologies
Papavramidou P. et al
In Proc.of IEEE VLSI Test Symposium (VTS) - IEEE VLSI Test Symposium (VTS), United States (2012) [hal-00815986 - version 1]
Designing Robust Single-Chip Massively-Parallel Tera-Device Processors
Nicolaidis M.
In Proc of 4th Design for Reliability Workshop (DFR) - Proc. of 4th Design for Reliability Workshop (DFR), France (2012) [hal-00815969 - version 1]
Experimental Assessment of Cache Memory Soft Error Rate Prediction Technique
Houssany S. et al
In Proc. of 13th European Conference on Radiation and its Effects on Components and Systems (RADECS) - 13th European Conference on Radiation and its Effects on Components and Systems (RADECS), France (2012) [hal-00815960 - version 1]
A Formal Framework for Testing with Assertion Checkers in Mixed-Signal Simulation
Pierre L.
In Proc. of IEEE International Conference on Electronics, Circuits, and Systems (ICECS'2012) - IEEE International Conference on Electronics, Circuits, and Systems (ICECS'2012), Spain (2012) [hal-00815923 - version 1]
New smart readout technique performing edge detection designed to control vision sensors dataflow
Amhaz H. et al
In Proc. of 24th IS&T/SPIE Electronic Imaging Conference, Burlingame, California, United States, January 22-26 - 24th IS&T/SPIE Electronic Imaging Conference, United States (2012) [hal-00815817 - version 1]
Fast simulation of systems embedding VLIW processors
Michel L. et al
In Proc. of IEEE/ACM/IFIP international conference on Hardware/software codesign and system synthesis (CODES+ISSS), Tampere, Finland, October 7-12 - IEEE/ACM/IFIP international conference on Hardware/software codesign and system synthesis (CODES+ISSS), Finland (2012) [hal-00815815 - version 1]