279 articles – 2094 references  [version française]
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New pedagogical experiment leading to awareness in nanosciences and nanotechnologies for young generations at secondary school
Excoffon E. et al
In Proc. of International Conference on Information Technology Based Higher Education and Training (ITHET'12) - International Conference on Information Technology Based Higher Education and Training (ITHET'12), Turkey (2012) [hal-00747415 - version 1]
Hardware compression scheme based on low-complexity arithmetic encoding for low power image transmission over WSNs
Chefi A. et al
In Proc. of 1st Workshop on Architecture of Smart Camera (WASC'12) - 1st Workshop on Architecture of Smart Camera (WASC'12), France (2012) [hal-00747395 - version 1]
Self-Timed Rings as Entropy Sources
Cherkaoui A. et al
Dans Proc. of 18th IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC) - 18th IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC), Danemark (2012) [hal-00747383 - version 1]
A predictive bottom-up hierarchical approach to digital system reliability
Huard V. et al
Dans Proc. of IEEE International Reliability Physics Symposium (IRPS'12) - IEEE International Reliability Physics Symposium (IRPS'12), États-Unis (2012) [hal-00747363 - version 1]
Electromigration degradation mechanism analysis of SnAgCu interconnects for eWLB package
Frank T. et al
Dans Proc. of IEEE International Reliability Physics Symposium (IRPS'12) - IEEE International Reliability Physics Symposium (IRPS'12), États-Unis (2012) [hal-00747359 - version 1]
An automated SEU fault-injection method and tool for HDLbased designs
Mansour W. et al
Dans Proc of Radiation Effects on Components and Systems (RADECS'12) - Radiation Effects on Components and Systems (RADECS'12), France (2012) [hal-00747354 - version 1]
Continuous high-altitude measurements of cosmic ray neutrons and SEU/MCU at various locations: correlation and analyses based on MUSCA SEP3
Hubert G. et al
Dans Proc. of Radiation Effects on Components and Systems (RADECS'12) - Radiation Effects on Components and Systems (RADECS'12), France (2012) [hal-00747172 - version 1]
Characterization of the neutron environment at the CERN-EU High Energy Reference Field and at the Pic du Midi
Cheminet A. et al
Dans Proc. of Radiation Effects on Components and Systems (RADECS'12) - Radiation Effects on Components and Systems (RADECS'12), France (2012) [hal-00747152 - version 1]
Model of a Simple yet effective Operational Amplifier
Paugnat F. et al
Dans Proc. of International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD'12) - International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD'12), Espagne (2012) [hal-00746450 - version 1]
SEU Fault-Injection in VHDL-Based Processors: A Case Study
Mansour W. et al
Dans Proc. of 13th Latin-American Test Workshop (LATW'12) - 13th Latin-American Test Workshop (LATW'12), Équateur (2012) [hal-00745846 - version 1]
HCM: An Abstraction Layer for Seamless Programming of DPR FPGA
Yan X. et al
In Proc. of 2nd Internation Conference on Field Programmable Logic and Applications (FPL'12) - 2nd Internation Conference on Field Programmable Logic and Applications (FPL'12), Norway (2012) [hal-00745837 - version 1]
A 3D-NoC Router Implementation Exploiting Vertically-Partially-Connected Topologies
Bahmani M. et al
Dans Proc. of IEEE Computer Society Annual Symposium on VLSI (ISVLSI'12) - IEEE Computer Society Annual Symposium on VLSI (ISVLSI'12), États-Unis (2012) [hal-00745456 - version 1]
Advances in variation-aware modeling, verification, and testing of analog ICs
De Jonghe D. et al
In Proc. of IEEE Design, Automation and Test in Europe Conference (DATE'12) - IEEE Design, Automation and Test in Europe Conference (DATE'12), Germany (2012) [hal-00745388 - version 1]
Ternary Stimulus for Fully Digital Dynamic Testing of SC ΣΔ ADCs
Dubois M. et al
In Proc. of IEEE International Mixed-Signals, Sensors, and Systems Test Workshop (IMSTW'12) - IEEE International Mixed-Signals, Sensors, and Systems Test Workshop (IMSTW'12), Taiwan (2012) [hal-00745378 - version 1]
Analog/RF test ordering in the early stages of production testing
Akkouche N. et al
Dans Proc. of 30th IEEE VLSI Test Symposium - 30th IEEE VLSI Test Symposium, États-Unis (2012) [hal-00745104 - version 1]
Integrating PSL Properties into SystemC Transactional Modeling - Application to the Verification of a Modem SoC
Pierre L. et al
Dans Proc. of IEEE International Symposium on Industrial Embedded Systems (SIES'2012) - IEEE International Symposium on Industrial Embedded Systems (SIES'2012), Allemagne (2012) [hal-00745099 - version 1]
A Mixed Verification Strategy Tailored for Networks on Chip
Tsiligiannis G. et al
Dans Proc. of Sixth IEEE/ACM International Symposium onNetworks on Chip (NoCS'12) - Sixth IEEE/ACM International Symposium onNetworks on Chip (NoCS'12), Danemark (2012) [hal-00745086 - version 1]
RIIF - Reliability Information Interchange Format
Evans A. et al
Dans Proc. of 18th IEEE International On-Line Testing Symposium (IOLTS'12° - 18th IEEE International On-Line Testing Symposium (IOLTS'12), Espagne (2012) [hal-00744609 - version 1]
Enhanced Reduced Code Linearity Test Technique for Multi-bit/Stage Pipeline ADCs
Laraba A. et al
In Proceedings of the IEEE 17th European Test Symposium (ETS'12) - IEEE 17th European Test Symposium (ETS'12), France (2012) [hal-00744573 - version 1]
Design for Test and Reliability in Ultimate CMOS
Nicolaidis M. et al
Dans Proc. of Design, Automation and Test in Europe (DATE'12) - Design, Automation and Test in Europe (DATE'12), Allemagne (2012) [hal-00688282 - version 1]