279 articles – 2093 references  [version française]
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Hardware compression scheme based on low-complexity arithmetic encoding for low power image transmission over WSNs
Chefi A. et al
In Proc. of 1st Workshop on Architecture of Smart Camera (WASC'12) - 1st Workshop on Architecture of Smart Camera (WASC'12), France (2012) [hal-00747395 - version 1]
Self-Timed Rings as Entropy Sources
Cherkaoui A. et al
Dans Proc. of 18th IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC) - 18th IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC), Danemark (2012) [hal-00747383 - version 1]
A predictive bottom-up hierarchical approach to digital system reliability
Huard V. et al
Dans Proc. of IEEE International Reliability Physics Symposium (IRPS'12) - IEEE International Reliability Physics Symposium (IRPS'12), États-Unis (2012) [hal-00747363 - version 1]
Electromigration degradation mechanism analysis of SnAgCu interconnects for eWLB package
Frank T. et al
Dans Proc. of IEEE International Reliability Physics Symposium (IRPS'12) - IEEE International Reliability Physics Symposium (IRPS'12), États-Unis (2012) [hal-00747359 - version 1]
An automated SEU fault-injection method and tool for HDLbased designs
Mansour W. et al
Dans Proc of Radiation Effects on Components and Systems (RADECS'12) - Radiation Effects on Components and Systems (RADECS'12), France (2012) [hal-00747354 - version 1]
Continuous high-altitude measurements of cosmic ray neutrons and SEU/MCU at various locations: correlation and analyses based on MUSCA SEP3
Hubert G. et al
Dans Proc. of Radiation Effects on Components and Systems (RADECS'12) - Radiation Effects on Components and Systems (RADECS'12), France (2012) [hal-00747172 - version 1]
Characterization of the neutron environment at the CERN-EU High Energy Reference Field and at the Pic du Midi
Cheminet A. et al
Dans Proc. of Radiation Effects on Components and Systems (RADECS'12) - Radiation Effects on Components and Systems (RADECS'12), France (2012) [hal-00747152 - version 1]
Model of a Simple yet effective Operational Amplifier
Paugnat F. et al
Dans Proc. of International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD'12) - International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD'12), Espagne (2012) [hal-00746450 - version 1]
SEU Fault-Injection in VHDL-Based Processors: A Case Study
Mansour W. et al
Dans Proc. of 13th Latin-American Test Workshop (LATW'12) - 13th Latin-American Test Workshop (LATW'12), Équateur (2012) [hal-00745846 - version 1]
HCM: An Abstraction Layer for Seamless Programming of DPR FPGA
Yan X. et al
In Proc. of 2nd Internation Conference on Field Programmable Logic and Applications (FPL'12) - 2nd Internation Conference on Field Programmable Logic and Applications (FPL'12), Norway (2012) [hal-00745837 - version 1]
A 3D-NoC Router Implementation Exploiting Vertically-Partially-Connected Topologies
Bahmani M. et al
Dans Proc. of IEEE Computer Society Annual Symposium on VLSI (ISVLSI'12) - IEEE Computer Society Annual Symposium on VLSI (ISVLSI'12), États-Unis (2012) [hal-00745456 - version 1]
Advances in variation-aware modeling, verification, and testing of analog ICs
De Jonghe D. et al
In Proc. of IEEE Design, Automation and Test in Europe Conference (DATE'12) - IEEE Design, Automation and Test in Europe Conference (DATE'12), Germany (2012) [hal-00745388 - version 1]
Ternary Stimulus for Fully Digital Dynamic Testing of SC ΣΔ ADCs
Dubois M. et al
In Proc. of IEEE International Mixed-Signals, Sensors, and Systems Test Workshop (IMSTW'12) - IEEE International Mixed-Signals, Sensors, and Systems Test Workshop (IMSTW'12), Taiwan (2012) [hal-00745378 - version 1]
Analog/RF test ordering in the early stages of production testing
Akkouche N. et al
Dans Proc. of 30th IEEE VLSI Test Symposium - 30th IEEE VLSI Test Symposium, États-Unis (2012) [hal-00745104 - version 1]
Integrating PSL Properties into SystemC Transactional Modeling - Application to the Verification of a Modem SoC
Pierre L. et al
Dans Proc. of IEEE International Symposium on Industrial Embedded Systems (SIES'2012) - IEEE International Symposium on Industrial Embedded Systems (SIES'2012), Allemagne (2012) [hal-00745099 - version 1]
A Mixed Verification Strategy Tailored for Networks on Chip
Tsiligiannis G. et al
Dans Proc. of Sixth IEEE/ACM International Symposium onNetworks on Chip (NoCS'12) - Sixth IEEE/ACM International Symposium onNetworks on Chip (NoCS'12), Danemark (2012) [hal-00745086 - version 1]
RIIF - Reliability Information Interchange Format
Evans A. et al
Dans Proc. of 18th IEEE International On-Line Testing Symposium (IOLTS'12° - 18th IEEE International On-Line Testing Symposium (IOLTS'12), Espagne (2012) [hal-00744609 - version 1]
Enhanced Reduced Code Linearity Test Technique for Multi-bit/Stage Pipeline ADCs
Laraba A. et al
In Proceedings of the IEEE 17th European Test Symposium (ETS'12) - IEEE 17th European Test Symposium (ETS'12), France (2012) [hal-00744573 - version 1]
Design for Test and Reliability in Ultimate CMOS
Nicolaidis M. et al
Dans Proc. of Design, Automation and Test in Europe (DATE'12) - Design, Automation and Test in Europe (DATE'12), Allemagne (2012) [hal-00688282 - version 1]
Testing RF Circuits With True Non-Intrusive Built-In Sensors
Abdallah L. et al
Dans Proc. of Design, Automation and Test in Europe (DATE'12) - Design, Automation and Test in Europe (DATE'12), Allemagne (2012) [hal-00688270 - version 1]