.:. Browse > List by publication type > Peer-reviewed conference/proceedings .:.

1240 documents ordered by : Date Title first author name document type Submit date

... 3 - 4 - 5 - 6 - 7 - 8 - 9 ...

A Practical Approach to Single Event Transients Analysis for Highly Complex Designs Alexandrescu D. et al In Proc. of IEEE International Symposium on Defect and Fault Tolerance in VLSI & Nanotechnology Systems (DFT'11) - IEEE International Symposium on Defect and Fault Tolerance in VLSI & Nanotechnology Systems (DFT'11), Canada (2011) [hal-00671330 - version 1]

Hardware compression solution based on HWT for low power image transmission in WSN Chefi A. et al Dans Proc. of 23rd IEEE International Conference on Microelectronics (ICM'11) - 23rd IEEE International Conference on Microelectronics (ICM'11), Tunisie (2011) [hal-00671327 - version 1]

An improved smart readout technique based on temporal redundancies suppression designed for logarithmic CMOS image sensor Amhaz H. et al Dans Proc. of 18th IEEE International Conference on Electronics, Circuits and Systems (ICECS'11) - 18th IEEE International Conference on Electronics, Circuits and Systems (ICECS'11), Liban (2011) [hal-00671019 - version 1]

Smart readout technique designed for logarithmic CMOS image sensor including a motion detection scheme Amhaz H. et al Dans Proc. of 9th IEEE International Conference on New Circuits and Systems (NEWCAS'11) - 9th IEEE International Conference on New Circuits and Systems (NEWCAS'11), France (2011) [hal-00671015 - version 1]

Temperature Compensation Scheme for Logarithmic CMOS Image Sensor Zimouche H. et al Dans Proc. of International Image Sensor Workshop (IISW'11) - International Image Sensor Workshop (IISW'11), Japon (2011) [hal-00670962 - version 1]

Smart Readout Technique based on Temporal Redundancies Suppression Designed for Logarithmic CMOS Image Sensor Amhaz H. et al Dans Proc. of International Image Sensor Workshop (IISW'11) - International Image Sensor Workshop (IISW'11), Japon (2011) [hal-00670949 - version 1]

Temperature compensated logarithmic CMOS image sensor using CMOS voltage reference Bandgap method Zimouche H. et al Dans Proc. of 9th IEEE International Conference on New Circuits and Systems (NEWCAS'11) - 9th IEEE International Conference on New Circuits and Systems (NEWCAS'11), France (2011) [hal-00670944 - version 1]

SystemC-AMS high-level modeling of linear analog blocks with power consumption information Bousquet L. et al Dans Proc. of IEEE 12th IEEE Latin American Test Workshop (LATW'11) - IEEE 12th IEEE Latin American Test Workshop (LATW'11), Brésil (2011) [hal-00653443 - version 1]

PPM-Accuracy Error Estimates for Low-Cost Analog Test: A Case Study Kupp N. et al Dans Proc. of IEEE International Mixed-Signals, Sensors, and Systems Test Workshop (IMS3TW'11) - IEEE International Mixed-Signals, Sensors, and Systems Test Workshop (IMS3TW'11), États-Unis (2011) [hal-00653434 - version 1]

Diagnostic de fautes de circuits analogiques basé sur l'estimation non paramétrique de densité Huang K. et al Dans Journées GDR SoC-SiP - Journées GDR SoC-SiP, Lyon, France, June 15-17, France (2011) [hal-00653423 - version 1]

Conception et évaluation d'une technique de test pour un mélangeur RF Abdallah L. et al Dans Journées GDR SoC-SiP - Journées GDR SoC-SiP, France (2011) [hal-00653411 - version 1]

Evaluation d'un BIST d'un capteur de vision CMOS à base d'une copule non Gaussienne Beznia K. et al In Journées GDR SoC-SiP - Journées GDR SoC-SiP, France (2011) [hal-00653389 - version 1]

A Performance Comparison Between the SystemC-AMS Models of Computation Paugnat F. et al Dans Proc. of edaWorkshop - edaWorkshop, Allemagne (2011) [hal-00652944 - version 1]

Moniteurs embarqués pour le test à bas coût d'un front-end RF Abdallah L. et al Dans Proc. of 14èmes Journées Nationales du Réseau Doctoral en Microélectronique (JNRDM'11) - 14ème Journées Nationales du Réseau Doctoral en Microélectronique (JNRDM'11), France (2011) [hal-00652938 - version 1]

Evaluation de la technique de test basée sur la mesure d'un nombre réduit de codes pour les convertisseurs analogique-numérique de type pipeline Laraba A. et al Dans Proc. of 14ème Journées Nationales du Réseau Doctoral en Microélectronique (JNRDM'11) - 14èmes Journées Nationales du Réseau Doctoral en Microélectronique (JNRDM'11), France (2011) [hal-00652932 - version 1]

Test metrics estimation of complex analog and mixed-signal circuits at the design stage Dubois M. Dans Proc. of PhD Forum at IEEE Design, Automation and Test in Europe Conference - PhD Forum at IEEE Design, Automation and Test in Europe Conference, Grenoble, March 12-16, France (2011) [hal-00652924 - version 1]

Optimization of production test of analog and RF circuits using statistical modeling techniques Akkouche N. In Proc. of PhD Forum at IEEE Design, Automation and Test in Europe Conference - PhD Forum at IEEE Design, Automation and Test in Europe Conference, Grenoble, France (2011) [hal-00652920 - version 1]

SystemC-AMS model of a CMOS video sensor. Open SystemC Initiative (OSCI) Cenni F. et al In Proc. of SystemC AMS Day 2011: Industry Adoption of the SystemC AMS Standard - SystemC AMS Day 2011: Industry Adoption of the SystemC AMS Standard, Germany (2011) [hal-00652914 - version 1]

Behavioral modeling of a CMOS video sensor platform using SystemC AMS / TLM Cenni F. et al In Proc. of IEEE Forum for Design Languages (FDL'11) - IEEE Forum for Design Languages (FDL'11), Germany (2011) [hal-00652897 - version 1]

SystemC-AMS behavioral modeling of a CMOS video sensor Cenni F. et al In Proc. of 19th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC'11) - 19th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC'11), China (2011) [hal-00652374 - version 1]