248 articles – 2008 references  [version française]
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Enhanced Reduced Code Linearity Test Technique for Multi-bit/Stage Pipeline ADCs
Laraba A. et al
In Proceedings of the IEEE 17th European Test Symposium (ETS'12) - IEEE 17th European Test Symposium (ETS'12), France (2012) [hal-00744573 - version 1]
Kth-Aggressor Fault (KAF)-based Thru-Silicon-Via Interconnect Built-In Self-Test and Diagnosis
Pasca V. et al
Journal of Electronic Testing: Theory and Application 28 (2012) Online First™, 3 August [hal-00744561 - version 1]
Adaptive Gain and Analog Wavelet Transform for Low-Power Infrared Image Sensors
Villard P. et al
Active and Passive Electronic Components Journal (APEC) 2012, Article ID 610176 (2012) 6 [hal-00744450 - version 1]
Native Simulation of MPSoC Using Hardware-Assisted Virtualization
Shen H. et al
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 31, 7 (2012) 1074 - 1087 [hal-00744439 - version 1]
A Fault Tolerant Approach to Detect Transient Faults in Microprocessors Based on a Non-Intrusive Reconfigurable Hardware
Azambuja J.R. et al
IEEE Transactions on Nuclear Science 59, 4 (2012) 1117 - 1124 [hal-00744240 - version 1]
Improving SEU Fault Tolerance Capabilities of a Self-Converging Algorithm
Velazco R. et al
IEEE Transactions on Nuclear Science 59, 4 (2012) 818 - 823 [hal-00744228 - version 1]
Adaptive Alternate Analog Test
Stratigopoulos H. et al
IEEE Design and Test of Computers 29, 04 (2012) 71-79 [hal-00743573 - version 1]
Test Metrics Model for Analog Test Development
Stratigopoulos H.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 31, 7 (2012) 1116 - 1128 [hal-00743570 - version 1]
Diagnosis of Local Spot Defects in Analog Circuits
Huang K. et al
IEEE Transactions on Instrumentation and Measurement 61, 10 (2012) 2701 - 2712 [hal-00743568 - version 1]
VLSI-SoC: The Advanced Research for Systems on Chip
Mir S. et al
(2012) VII, 187 p. 104 illus. [hal-00711988 - version 1]
Property-Based Dynamic Verification and Test
Borrione D. et al
In Design Technology for Heterogeneous Embedded Systems (2012) 157-176 [hal-00688409 - version 1]
Design for Test and Reliability in Ultimate CMOS
Nicolaidis M. et al
In Proc. of Design, Automation and Test in Europe (DATE'12) - Design, Automation and Test in Europe (DATE'12), Germany (2012) [hal-00688282 - version 1]
Testing RF Circuits With True Non-Intrusive Built-In Sensors
Abdallah L. et al
In Proc. of Design, Automation and Test in Europe (DATE'12) - Design, Automation and Test in Europe (DATE'12), Germany (2012) [hal-00688270 - version 1]
Enhancing Non-Linear Kernels by an Optimized Memory Hierarchy in a High Level Synthesis Flow
Mancini S. et al
In Proc. of Design, Automation and Test in Europe (DATE'12) - Design, Automation and Test in Europe (DATE'12), Germany (2012) [hal-00688269 - version 1]
Holistic Modeling of Embedded Systems with Multi-Discipline Feedback: Application to a Precollision Mitigation Braking System
Lévêque A. et al
In Proc. of Design, Automation and Test in Europe (DATE'12) - Design, Automation and Test in Europe (DATE'12), Germany (2012) [hal-00688263 - version 1]
Detailed analysis of compilation options for robust software-based embedded systems
Wecxsteen A. et al
In Proc. of 13th Latin-American Test Workshop (LATW'12) - 13th Latin-American Test Workshop (LATW'12), Ecuador (2012) [hal-00688246 - version 1]
Pattern-based injections in processors implemented on SRAM-based FPGAs
Ben Jrad M. et al
In Proc. of 13th Latin-American Test Workshop (LATW'12) - 13th Latin-American Test Workshop (LATW'12), Ecuador (2012) [hal-00688242 - version 1]
On Software Simulation for MPSoC. A Modeling Approach for Functional Validation and Performance Estimation
Shen H. et al
In Design Technology for Heterogeneous Embedded Systems (2012) chapter 5: 91-114 [hal-00680484 - version 1]
On the Dependability of 3D Interconnects
Anghel L.
In Ecole d'hiver Francophone sur les Technologies de Conception des Systèmes embarqués Hétérogènes (FETCH'12) - Ecole d'hiver Francophone sur les Technologies de Conception des Systèmes embarqués Hétérogènes (FETCH'12), France (2012) [hal-00677047 - version 1]
Towards Low-cost Soft Error Mitigation in SRAM-based FPGAs: a Case Study on AT40K
Ferron J. et al
In Proc. of 3rd IEEE Latin American Symposium on Circuits and Systems (LASCAS'12) - 3rd IEEE Latin American Symposium on Circuits and Systems (LASCAS'12), Mexico (2012) [hal-00676825 - version 1]