284 articles – 2152 references  [version française]
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Transparent BIST for ECC-based memory repair
Nicolaidis M. et al
Dans IEEE International On-Line Testing Symposium (IOLTS'13) - IEEE International On-Line Testing Symposium (IOLTS'13), Grèce (2013) [hal-01021367 - version 1]
Variability-aware and fault-tolerant self-adaptive applications for many-core chips
Chaix F. et al
In IEEE International On-Line Testing symposium (IOLTS'13) - IEEE International On-Line Testing symposium (IOLTS'13), Greece (2013) [hal-01021359 - version 1]
The scandal of the computational universe, Second part: relativity and quantum mechanics
Nicolaidis M.
Dans Computing and Philosophy Symposium (AISB Convention'13) - Computing and Philosophy Symposium (AISB Convention'13), Royaume-Uni (2013) [hal-01018414 - version 1]
The scandal of the computational universe, First part: the qualitative concepts
Nicolaidis M.
Dans Computing and Philosophy Symposium (AISB Convention'13) - Computing and Philosophy Symposium (AISB Convention'13), Royaume-Uni (2013) [hal-01018411 - version 1]
Statistical learning for test and control of analog/RF circuits
Mir S.
Dans 4th European Workshop on CMOS Variability (VARI) - 4th European Workshop on CMOS Variability (VARI), Allemagne (2013) [hal-01018404 - version 1]
System-level modeling of electromechanical devices with energy consumption
Bousquet L. et al
Dans 7th International IEEE Systems Conference (Syscon 2013) - 7th International IEEE Systems Conference (Syscon 2013), États-Unis (2013) [hal-01018380 - version 1]
BIST of interconnection lines in the pixel matrix of CMOS imagers
Fei R. et al
Dans 5th International Workshop on Advances in Sensors and Interfaces (IWASI), Bari, Italy - 5th International Workshop on Advances in Sensors and Interfaces (IWASI), Italie (2013) [hal-01017962 - version 1]
Output parameter reduction for an efficient evaluation of alternative test techniques
Beznia K. et al
Dans 28th International Conference on Design of Circuits and Integrated Systems (DCIS'13), San Sebastian, Spain - 28th International Conference on Design of Circuits and Integrated Systems (DCIS'13), San Sebastian, Spain, Espagne (2013) [hal-01017501 - version 1]
fulltext access Toward a real-time tracking of a medical deformable needle from strain measurements.
Robert A.L.G. et al
Conference proceedings : Annual International Conference of the IEEE Engineering in Medicine and Biology Society. 2013 (2013) 3495-8 [hal-01006353 - version 1]
Fault-tolerant adaptive routing under permanent and temporary failures for many-core systems-on-chip
Dimopulos M. et al
Dans IEEE International On-Line Testing symposium (IOLTS'13) - IEEE International On-Line Testing symposium (IOLTS'13), France (2013) [hal-00997169 - version 1]
fulltext access A Defect-tolerant Cluster in a Mesh SRAM-based FPGA
Ben Dhia A. et al
Dans International Conference on Field-Programmable Technology (FPT) - International Conference on Field-Programmable Technology (FPT), Japon (2013) [hal-00987365 - version 1]
A defect-tolerant cluster in a mesh SRAM-based FPGA
Ben Dhia A. et al
Dans International Conference on Field-Programmable Technology (FPT) - International Conference on Field-Programmable Technology (FPT), Japon (2013) [hal-00982852 - version 1]
BIST for Logic and Local Interconnect Resources in a Novel Mesh of Cluster FPGA
Rehman S.-U. et al
Dans IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), États-Unis (2013) [hal-00982772 - version 1]
Reduced code linearity testing of pipeline adcs in the presence of noise
Laraba A. et al
Dans IEEE VLSI Test Symposium (VTS'13) - IEEE VLSI Test Symposium (VTS'13), Berkeley, CA, USA, April 29 - May 02, États-Unis (2013) [hal-00975951 - version 1]
Defect-Oriented Non-Intrusive RF Test Using On-Chip Temperature Sensors
Abdallah L. et al
Dans IEEE VLSI Test Symposium (VTS'13) - IEEE VLSI Test Symposium (VTS'13), , USA, April 29 - May 02, États-Unis (2013) [hal-00975942 - version 1]
Multidimensional analog test metrics estimation using extreme value theory and statistical blockade
Mohamed F. et al
Dans 50th ACM / EDAC / IEEE Design Automation Conference (DAC) - 50th ACM / EDAC / IEEE Design Automation Conference (DAC), États-Unis (2013) [hal-00975424 - version 1]
Fault modeling and diagnosis for nanometric analog circuits
Huang K. et al
Dans IEEE International Test Conference (ITC'13) - IEEE International Test Conference (ITC'13), États-Unis (2013) [hal-00975410 - version 1]
True Non-Intrusive Sensors for RF Built-In Test
Abdallah L. et al
Dans IEEE International Test Conference (ITC'13) - IEEE International Test Conference (ITC'13), États-Unis (2013) [hal-00975407 - version 1]
Optimization of a self-converging algorithm at assembly level to improve SEU Fault-Tolerance
Marques C.A. et al
Dans 4th Latin American Symposium on Circuits And Systems (LASCAS) - 4th Latin American Symposium on Circuits And Systems (LASCAS), Pérou (2013) [hal-00973535 - version 1]
Error-rate prediction for programmable circuits: methodology, tools and studied cases
Velazco R.
Dans SPIE Micro- and Nanotechnology Sensors, Systems, and Applications - SPIE Micro- and Nanotechnology Sensors, Systems, and Applications, États-Unis (2013) [hal-00973527 - version 1]