248 articles – 2008 references  [version française]
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Self-Timed Rings as Sources of Entropy
Cherkaoui A. et al
In Proc. of 6ème colloque du GDR SOC-SIP du CNRS - 6ème colloque du GDR SOC-SIP du CNRS, France (2012) [hal-00747474 - version 1]
New pedagogical experiment leading to awareness in nanosciences and nanotechnologies for young generations at secondary school
Excoffon E. et al
Dans Proc. of International Conference on Information Technology Based Higher Education and Training (ITHET'12) - International Conference on Information Technology Based Higher Education and Training (ITHET'12), Turquie (2012) [hal-00747415 - version 1]
Hardware compression scheme based on low-complexity arithmetic encoding for low power image transmission over WSNs
Chefi A. et al
In Proc. of 1st Workshop on Architecture of Smart Camera (WASC'12) - 1st Workshop on Architecture of Smart Camera (WASC'12), France (2012) [hal-00747395 - version 1]
Self-Timed Rings as Entropy Sources
Cherkaoui A. et al
In Proc. of 18th IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC) - 18th IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC), Denmark (2012) [hal-00747383 - version 1]
Controling variability and energy by design
Fesquet L.
In CMOS Emerging Technologies - CMOS Emerging Technologies, Canada (2012) [hal-00747376 - version 1]
A predictive bottom-up hierarchical approach to digital system reliability
Huard V. et al
In Proc. of IEEE International Reliability Physics Symposium (IRPS'12) - IEEE International Reliability Physics Symposium (IRPS'12), United States (2012) [hal-00747363 - version 1]
Electromigration degradation mechanism analysis of SnAgCu interconnects for eWLB package
Frank T. et al
In Proc. of IEEE International Reliability Physics Symposium (IRPS'12) - IEEE International Reliability Physics Symposium (IRPS'12), United States (2012) [hal-00747359 - version 1]
An automated SEU fault-injection method and tool for HDLbased designs
Mansour W. et al
In Proc of Radiation Effects on Components and Systems (RADECS'12) - Radiation Effects on Components and Systems (RADECS'12), France (2012) [hal-00747354 - version 1]
Continuous high-altitude measurements of cosmic ray neutrons and SEU/MCU at various locations: correlation and analyses based on MUSCA SEP3
Hubert G. et al
In Proc. of Radiation Effects on Components and Systems (RADECS'12) - Radiation Effects on Components and Systems (RADECS'12), France (2012) [hal-00747172 - version 1]
Characterization of the neutron environment at the CERN-EU High Energy Reference Field and at the Pic du Midi
Cheminet A. et al
In Proc. of Radiation Effects on Components and Systems (RADECS'12) - Radiation Effects on Components and Systems (RADECS'12), France (2012) [hal-00747152 - version 1]
Model of a Simple yet effective Operational Amplifier
Paugnat F. et al
Dans Proc. of International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD'12) - International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD'12), Espagne (2012) [hal-00746450 - version 1]
SEU Fault-Injection in VHDL-Based Processors: A Case Study
Mansour W. et al
Dans Proc. of 13th Latin-American Test Workshop (LATW'12) - 13th Latin-American Test Workshop (LATW'12), Équateur (2012) [hal-00745846 - version 1]
HCM: An Abstraction Layer for Seamless Programming of DPR FPGA
Yan X. et al
Dans Proc. of 2nd Internation Conference on Field Programmable Logic and Applications (FPL'12) - 2nd Internation Conference on Field Programmable Logic and Applications (FPL'12), Norvège (2012) [hal-00745837 - version 1]
A 3D-NoC Router Implementation Exploiting Vertically-Partially-Connected Topologies
Bahmani M. et al
In Proc. of IEEE Computer Society Annual Symposium on VLSI (ISVLSI'12) - IEEE Computer Society Annual Symposium on VLSI (ISVLSI'12), United States (2012) [hal-00745456 - version 1]
Advances in variation-aware modeling, verification, and testing of analog ICs
De Jonghe D. et al
In Proc. of IEEE Design, Automation and Test in Europe Conference (DATE'12) - IEEE Design, Automation and Test in Europe Conference (DATE'12), Germany (2012) [hal-00745388 - version 1]
Ternary Stimulus for Fully Digital Dynamic Testing of SC ΣΔ ADCs
Dubois M. et al
In Proc. of IEEE International Mixed-Signals, Sensors, and Systems Test Workshop (IMSTW'12) - IEEE International Mixed-Signals, Sensors, and Systems Test Workshop (IMSTW'12), Taiwan, Province Of China (2012) [hal-00745378 - version 1]
Analog/RF test ordering in the early stages of production testing
Akkouche N. et al
In Proc. of 30th IEEE VLSI Test Symposium - 30th IEEE VLSI Test Symposium, United States (2012) [hal-00745104 - version 1]
Integrating PSL Properties into SystemC Transactional Modeling - Application to the Verification of a Modem SoC
Pierre L. et al
In Proc. of IEEE International Symposium on Industrial Embedded Systems (SIES'2012) - IEEE International Symposium on Industrial Embedded Systems (SIES'2012), Germany (2012) [hal-00745099 - version 1]
A Mixed Verification Strategy Tailored for Networks on Chip
Tsiligiannis G. et al
In Proc. of Sixth IEEE/ACM International Symposium onNetworks on Chip (NoCS'12) - Sixth IEEE/ACM International Symposium onNetworks on Chip (NoCS'12), Denmark (2012) [hal-00745086 - version 1]
RIIF - Reliability Information Interchange Format
Evans A. et al
Dans Proc. of 18th IEEE International On-Line Testing Symposium (IOLTS'12° - 18th IEEE International On-Line Testing Symposium (IOLTS'12), Espagne (2012) [hal-00744609 - version 1]