282 articles – 2126 references  [version française]
.:. Browse > Document list .:.
2408 documents ordered by :
First Previous ... 104 - 105 - 106 - 107 - 108 - 109 - 110 ... Next Last
Evaluation and composition of specification languages, an industrial point of view
Romdhani A. et al
Dans Proceedings-of-the-ASP-DAC'95/CHDL'95/VLSI'95.-Asia-and-South-Pacific-Design-Automation-Conference.-IFIP-International-Conference-on-Computer-Hardware-Description-Languages-and-their-Applications.-IFIP-Interntional-Conference-on-Very-Large-Scale-Integrati - (1995) [hal-00008135 - version 1]
High level specification in electronic design
Kission P. et al
In ISIE-'95.-Proceedings-of-the-IEEE-International-Symposium-on-Industrial-Electronics - (1995) [hal-00008132 - version 1]
Industrial experience using rule-driven retargetable code generation for multimedia applications
Liem C. et al
In Proceedings-of-the-Eighth-International-Symposium-on-System-Synthesis - (1995) [hal-00008027 - version 1]
PARTIF: interactive system-level partitioning
Ismail T. et al
VLSI-Design 3(3-4) (1995) 333-45 [hal-00008026 - version 1]
Conference Reports
Chakravarty S. et al
IEEE Design and Test of Computers Winter 1995 (Vol. 12, No. 4) (1995) 95-97 [hal-00007992 - version 1]
Built-in test for circuits with scan based on reseeding of multiple-polynomial linear feedback shift registers
Hellebrand S. et al
IEEE Transactions on Computers February 1995 Vol. 44, No. 2 (1995) 223-233 [hal-00007944 - version 1]
Analog checkers with absolute and relative tolerances
Kolarik V. et al
IEEE-Transactions-on-Computer-Aided-Design-of-Integrated-Circuits-and-Systems Volume: 14, Issue: 5 (1995) 607-612 [hal-00007941 - version 1]
Mixed-signal circuits and boards for high safety applications
Lubaszewski M. et al
Dans European Design and Test Conference (ED&TC '95) - European Design and Test Conference (ED&TC '95), États-Unis (1995) [hal-00005881 - version 1]
Frequency-based BIST for analog circuit testing
Khaled S. et al
Dans Proceedings-13th-IEEE-VLSI-Test-Symposium- - (1995) [hal-00007936 - version 1]
Collective fabrication of microsystems compatible with CMOS through the CMP service
Karam J.M. et al
Materials-Science-&-Engineering-B-Solid-State-Materials-for-Advanced-Technology December 1995; Volume 35, Issues 1-3 (1995) 219-223 [hal-00007935 - version 1]
On-line and off-line testing: from digital to analog, from circuits to boards
Courtois B. et al
Dans ESSCIRC-'95.-Twenty-First-European-Solid-State-Circuits-Conference.-Proceedings - (1995) [hal-00007934 - version 1]
CAD framework concept for the design of integrated microsystems
Poppe A. et al
Proceedings-of-the-SPIE-The-International-Society-for-Optical-Engineering. September 1995; 2642 (1995) 215-224 [hal-00007929 - version 1]
A general CAD concept and design framework architecture for integrated microsystems
Poppe A. et al
Dans Simulation-and-Design-of-Microsystems-and-Microstructures - (1995) [hal-00007903 - version 1]
N/A : [({datebrevet})]
fulltext access Le test unifié de cartes appliqué à la conception de systèmes fiables
Lubaszewski M.
Institut National Polytechnique de Grenoble - INPG (20/06/1994), COURTOIS B. (Dir.) [tel-00010759 - version 1]
fulltext access Etude des liens entre la synthèse architecturale et la synthèse au niveau transfert de registres
Aichouchi M.
Institut National Polytechnique de Grenoble - INPG (1994-06-20), JERRAYA A. A. (Dir.) [tel-00010758 - version 1]
Netlist automatic extractor: "An image processing based software for bare board test data generation"
Benali A. et al
In Proceedings-of-the-Third-Asian-Test-Symposium-Cat.-No.94TH8016 - Proceedings-of-the-Third-Asian-Test-Symposium-Cat.-No.94TH8016, Japan (1994) [hal-00016097 - version 1]
Test of single fault tolerant controllers in VLSI circuits
Leveugle R.
IFIP-Transactions-A-Computer-Science-and-Technology A-42 (1994) 123-32 [hal-00015217 - version 1]
Taking advantage of ASICs to improve dependability with very low overheads (PLC)
Michel T. et al
In Proceedings.-The-European-Design-and-Test-Conference.-EDAC,-The-European-Conference-on-Design-Automation.-ETC-European-Test-Conference.-EUROASIC,-The-European-Event-in-ASIC-Design-Cat.-No.94TH0634-6 - Proceedings.-The-European-Design-and-Test-Conference.-EDAC,-The-European-Conference-on-Design-Automation.-ETC-European-Test-Conference.-EUROASIC,-The-European-Event-in-ASIC-Design-Cat.-No.94TH0634-6, France (1994) [hal-00015209 - version 1]
Taking advantage of high level functional information to refine timing analysis and timing information
Safinia C. et al
In Proceedings.-The-European-Design-and-Test-Conference.-EDAC,-The-European-Conference-on-Design-Automation.-ETC-European-Test-Conference.-EUROASIC,-The-European-Event-in-ASIC-Design-Cat.-No.94TH0634-6 - Proceedings.-The-European-Design-and-Test-Conference.-EDAC,-The-European-Conference-on-Design-Automation.-ETC-European-Test-Conference.-EUROASIC,-The-European-Event-in-ASIC-Design-Cat.-No.94TH0634-6, France (1994) [hal-00015207 - version 1]