279 articles – 2093 references  [version française]
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Aliasing-free signature analysis for RAM BIST
Yarmolik V.-N. et al
In Proceedings.-International-Test-Conference-1994-IEEE-Cat.-No.94CH3483-5. - Proceedings.-International-Test-Conference-1994-IEEE-Cat.-No.94CH3483-5., United States (1994) [hal-00013935 - version 1]
Zero aliasing ROM BIST
Kebichi O. et al
Journal-of-Electronic-Testing:-Theory-and-Applications Nov. ; 5(4) (1994) 377-88 [hal-00013934 - version 1]
Strongly fail-safe interfaces based on concurrent checking
Nicolaidis M.
In Proceedings-of-the-Third-Asian-Test-Symposium-Cat.-No.94TH8016. - Proceedings-of-the-Third-Asian-Test-Symposium-Cat.-No.94TH8016., Japan (1994) [hal-00013930 - version 1]
A test methodology applied to cellular logic programmable gate arrays
Duarte R.-O. et al
In Field-Programmable-Logic-Architectures,-Synthesis-and-Applications.-4th-International-Workshop-on-Field-Programmable-Logic-and-Applications,-FPL-'94.-Proceedings. - Field-Programmable-Logic-Architectures,-Synthesis-and-Applications.-4th-International-Workshop-on-Field-Programmable-Logic-and-Applications,-FPL-'94.-Proceedings., Czech Republic (1994) [hal-00013897 - version 1]
Re-engineering hardware specifications by exploiting design semantics
Mir S. et al
In Proceedings of EURO-DAC European Design Automation Conference - Proceedings of EURO-DAC European Design Automation Conference, France (1994) [hal-00013314 - version 1]
Built-in self-test and fault diagnosis of fully differential analogue circuits
Courtois B. et al
In Proceedings of 1994 IEEE International Conference on Computer Aided Design (CAD-94). 6-10 Nov. 1994 - Proceedings of 1994 IEEE International Conference on Computer Aided Design (CAD-94). 6-10 Nov. 1994, United States (1994) [hal-00013312 - version 1]
The design of fast asynchronous adder structures and their implementation using DCVS logic
Renaudin M. et al
In 1994-IEEE-International-Symposium-on-Circuits-and-Systems-Cat.-No.94CH3435-5 - 1994-IEEE-International-Symposium-on-Circuits-and-Systems-Cat.-No.94CH3435-5, United Kingdom (1994) [hal-00012055 - version 1]
Design of SEU-hardened CMOS memory cells: the HIT cell
Bessot D. et al
In RADECS-93 - (1994) [hal-00008260 - version 1]
Accelerating the design process by using architectural synthesis
Kission P. et al
In Proceedings-The-Fifth-International-Workshop-on-Rapid-System-Prototyping.-Shortening-the-Path-from-Specification-to-Prototype- - (1994) [hal-00008151 - version 1]
Towards a theory for hardware/software codesign
Voss M. et al
In Proceedings-of-the-Third-International-Workshop-on-Hardware/Software-Codesign - (1994) [hal-00008150 - version 1]
Structured design methodology for high-level design
Kission P. et al
Dans 31st-Design-Automation-Conference - (1994) [hal-00008149 - version 1]
A loop-based scheduling algorithm for hardware description languages
Rahmouni M. et al
Parallel Processing Letters Volume 4(3) (1994) 351-364 [hal-00008148 - version 1]
Interactive system-level partitioning with PARTIF
Ismail T. et al
Dans Proceedings.-The-European-Design-and-Test-Conference.-EDAC,-The-European-Conference-on-Design-Automation.-ETC-European-Test-Conference.-EUROASIC,-The-European-Event-in-ASIC-Design- - (1994) [hal-00008033 - version 1]
An approach for hardware-software codesign
Ismail T. et al
Dans Proceedings-The-Fifth-International-Workshop-on-Rapid-System-Prototyping.-Shortening-the-Path-from-Specification-to-Prototype - (1994) [hal-00008032 - version 1]
COSMOS: a codesign approach for communicating systems
Ismail T. et al
Dans Proceedings-of-the-Third-International-Workshop-on-Hardware/Software-Codesign - (1994) [hal-00008031 - version 1]
Designing self-exercising analogue checkers
Kolarik V. et al
Dans Proceedings-12th-IEEE-VLSI-Test-Symposium- - (1994) [hal-00007948 - version 1]
Built-in self-test and fault diagnosis of fully differential analogue circuits
Mir S. et al
Dans 1994-IEEE/ACM-International-Conference-on-Computer-Aided-Design.-Digest-of-Technical-Papers-IEEE - (1994) [hal-00007946 - version 1]
Multi project chip service in France
Courtois B.
Journal-of-the-Institute-of-Electronics,-Information-and-Communication-Engineers Jan. 1994; 77(1) (1994) 46-51 [hal-00007945 - version 1]
CAD and testing of ICs and systems: where are we going?
Courtois B.
Journal-of-Microelectronic-Systems-Integration. Sept. 1994; 2(3) (1994) 139-201 [hal-00007940 - version 1]
MPC services available worldwide
Courtois B.
In APCCAS-'94.-1994-IEEE-Asia-Pacific-Conference-on-Circuits-and-Systems - (1994) [hal-00007937 - version 1]