251 articles – 2007 references  [version française]
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Extended duplex fault tolerant system with integrated control flow checking
Delord X. et al
In Defect-and-Fault-Tolerance-in-VLSI-Systems.-Vol.2.-Proceedings-of-the-International-Workshop - Defect-and-Fault-Tolerance-in-VLSI-Systems.-Vol.2.-Proceedings-of-the-International-Workshop, United States (1990) [hal-00015249 - version 1]
Functional approaches applied to microprogrammed architectures
Borrione D. et al
Interntional-Journal-of-Computer-Aided-VLSI-Design 2(4) (1990) 339-58 [hal-00014302 - version 1]
Efficient UBIST implementation for microprocessor sequencing parts
Nicolaidis M.
In Proceedings-International-Test-Conference-1990-Cat.-No.90CH2910-6. - Proceedings-International-Test-Conference-1990-Cat.-No.90CH2910-6., United States (1990) [hal-00014037 - version 1]
Top down IC failure analysis using an E-beam system coupled to a functional teste
Velazco R. et al
Microelectronic-Engineering May 1990; 12(1-4) (1990) 113-120 [hal-00008272 - version 1]
Failure coverage of functional test methods: a comparative experimental evaluation
Velazco R. et al
In Proceedings-International-Test-Conference-1990 - (1990) [hal-00008271 - version 1]
Fluorescence, photoconductivity and polarization properties of divalent rare earth ions in fluoride crystals
Moine B. et al
Journal of Luminescence Volume 45, Issues 1-6 , January-February 1990 (1990) 248-250 [hal-00007976 - version 1]
Failure analysis using E-beam
Collin J. et al
Microelectronic Engineering Volume 12, Issues 1-4 , May 1990 (1990) 305-324 [hal-00007975 - version 1]
Description of a safe programming microprocessing unit for railway signalling
Chaumontet G. et al
In 7th-International-Conference-on-Reliability-and-Maintainability.-Proceedings. - (1990) [hal-00007968 - version 1]
High-level tools and methods for electron-beam debug and failure analysis of integrated circuits
Conard D. et al
Periodica-Polytechnica 34(4) (1990) 281-304 [hal-00007963 - version 1]
NAUTILE: a safe environment for silicon compilation
Bondono P. et al
In European Design Automation Conference Proceedings of the conference on European design automation - (1990) [hal-00007784 - version 1]
Robust tests for stuck-open faults and design for testability of reconvergent fan-out CMOS logic networks
Darlay F. et al
In EDAC.-Proceedings-of-the-European-Design-Automation-Conference. - (1990) [hal-00007780 - version 1]
fulltext access Contribution à NAUTILE : un environnement pour la compilation du silicium
Bondono P.
Institut National Polytechnique de Grenoble - INPG (1989-12-08), Bernard Courtois (Dir.) [tel-00335600 - version 1]
fulltext access Test aux ions lourds de VLSI programmables
Provost-Grellier A.
Institut National Polytechnique de Grenoble - INPG (1989-11-17), Raoul Velazco (Dir.) [tel-00334460 - version 1]
fulltext access Contribution à la définition et à la mise en œuvre de NAUTILE
Hornik A.
Institut National Polytechnique de Grenoble - INPG (1989-06-06), Bernard Courtois (Dir.) [tel-00333065 - version 1]
N/A : [({datebrevet})]
ASYL: a logic and architecture design automation system
Crastes-De-Paulet M. et al
In Euro-ASIC-89 - Euro-ASIC-89, France (1989) [hal-00015360 - version 1]
Built-in concurrent checking of ASICs
Delord X. et al
In Euro-ASIC-89 - Euro-ASIC-89, France (1989) [hal-00015357 - version 1]
Reconfiguration in a microprocessor: practical results
Leveugle R. et al
In ESPRIT-'89.-Proceedings-of-the-6th-Annual-ESPRIT-Conference-EUR-12512 - ESPRIT-'89.-Proceedings-of-the-6th-Annual-ESPRIT-Conference-EUR-12512, Belgium (1989) [hal-00015355 - version 1]
Optimized synthesis of dedicated controllers with concurrent checking capabilities
Leveugle R. et al
In International-Test-Conference-1989.-Proceedings.-Meeting-the-Tests-of-Time-Cat.-No.89CH2742-5 - International-Test-Conference-1989.-Proceedings.-Meeting-the-Tests-of-Time-Cat.-No.89CH2742-5, United States (1989) [hal-00015350 - version 1]
A channelless layout for multilevel synthesis with compiled cells
Saucier G. et al
In Proceedings.-1989-IEEE-International-Conference-on-Computer-Design:-VLSI-in-Computers-and-Processors-Cat.-No.89CH2794-6 - Proceedings.-1989-IEEE-International-Conference-on-Computer-Design:-VLSI-in-Computers-and-Processors-Cat.-No.89CH2794-6, United States (1989) [hal-00015347 - version 1]