284 articles – 2152 references  [version française]
.:. Browse > List by authors > Alexandrescu .:.
13 documents ordered by :

A Standards Based Approach to the Reliability Specification of IP Components
Evans A. et al
Dans 2nd Workshop on Manufacturable and Dependable, Multicore Architectures at Nanoscale (MEDIAN'13) - 2nd Workshop on Manufacturable and Dependable, Multicore Architectures at Nanoscale (MEDIAN'13), France (2013) [hal-01021374 - version 1]
A Practical Approach to Single Event Transient Analysis For Highly Complex Design
Costenaro E. et al
Journal of Electronic Testing - Theory and Applications 29, 3, June (2013) 301-315 [hal-00873834 - version 1]
Towards a Hierarchical and Scalable Approach for Modeling the Effects of SETs
Costenaro E. et al
In Proc. of IEEE Workshop on Silicon Errors in Logic - System Effects (SELSE) - IEEE Workshop on Silicon Errors in Logic - System Effects (SELSE), United States (2013) [hal-00842816 - version 1]
A Standards Based Approach to the Reliability Specification of IP Components
Evans A. et al
In IP-SOC Conference - IP-SOC Conference, France (2012) [hal-00840774 - version 1]
RIIF - Reliability Information Interchange Format
Evans A. et al
Dans Proc. of 18th IEEE International On-Line Testing Symposium (IOLTS'12° - 18th IEEE International On-Line Testing Symposium (IOLTS'12), Espagne (2012) [hal-00744609 - version 1]
A Practical Approach to Single Event Transients Analysis for Highly Complex Designs
Alexandrescu D. et al
In Proc. of IEEE International Symposium on Defect and Fault Tolerance in VLSI & Nanotechnology Systems (DFT'11) - IEEE International Symposium on Defect and Fault Tolerance in VLSI & Nanotechnology Systems (DFT'11), Canada (2011) [hal-00671330 - version 1]
Dealing with Soft Errors in Complex Electronic Systems
Alexandrescu D. et al
Dans 18th Annual Single Event Effects Symposium (SEE'09) - 18th Annual Single Event Effects Symposium (SEE'09), États-Unis (2009) [hal-00472170 - version 1]
Complex Electronic Systems Soft Error Rate (SER) Management
Alexandrescu D. et al
Dans 14th IEEE European Test Symposium (ETS'09) - 14th IEEE European Test Symposium (ETS'09), Espagne (2009) [hal-00472167 - version 1]
Single-Event Upset and Soft Error Rate in Power ArchitectureTM microprocessors
Bellin D. et al
Dans Proceedings of Components for Military and Space Electronics (CMSE'08), San Diego (USA), February 11-14 - Components for Military and Space Electronics Conference (CMSE'08), États-Unis (2008) [hal-00416554 - version 1]
Low-Cost Highly-Robust Hardened Storage Cells Using Blocking Feedback Transistors
Nicolaidis M. et al
Dans Proc. of VLSI Test Symposium (VTS'08) - IEEE VLSI Test Symposium (VTS'08), États-Unis (2008) [hal-00378128 - version 1]
Simulating single event transients in VDSM ICs for ground level radiation
Alexandrescu D. et al
Journal-of-Electronic-Testing:-Theory-and-Applications Aug. ; 20(4) (2004) 413-21 [hal-00013725 - version 1]
New methods for evaluating the impact of single event transients in VDSM ICs
Alexandrescu D. et al
In Proceedings-17th-IEEE-International-Symposium-on-Defect-and-Fault-Tolerance-in-VLSI-Systems.-DFT-2002 - Proceedings-17th-IEEE-International-Symposium-on-Defect-and-Fault-Tolerance-in-VLSI-Systems.-DFT-2002, Canada (2002) [hal-00013736 - version 1]
Evaluation of a Soft Error Tolerance Technique Based on Time and/or Space Redundancy
Anghel L. et al
Dans 13th Symposium on Integrated Circuits and Systems Design (SBCCI'00) - 13th Symposium on Integrated Circuits and Systems Design (SBCCI'00), Brésil (2000) [hal-00005833 - version 1]