248 articles – 2008 references  [version française]
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Failure coverage of functional test methods: a comparative experimental evaluation
Velazco R. et al
In Proceedings-International-Test-Conference-1990 - (1990) [hal-00008271 - version 1]
Analysis of experimental results on functional testing and diagnosis of complex circuits
Bellon C. et al
Dans International-Test-Conference-1988-Proceedings-New-Frontiers-in-Testing-Cat.-No.88CH2610-4 - International-Test-Conference-1988-Proceedings-New-Frontiers-in-Testing-Cat.-No.88CH2610-4, États-Unis (1988) [hal-00013338 - version 1]
The GAPT system: a test chain for microprocessors
Bellon C. et al
Onde Electrique Nov. ; 65(6) (1985) 99-109 [hal-00013346 - version 1]
Automatic generation of microprocessor test programs
Bellon C. et al
In ACM-IEEE-Nineteenth-Design-Automation-Conference-Proceedings - ACM-IEEE-Nineteenth-Design-Automation-Conference-Proceedings, United States (1984) [hal-00013362 - version 1]
A behavioural test method for microprocessors and complex circuits
Bellon C. et al
In European-Conference-on-Electronic-Design-Automation-EDA-84. - European-Conference-on-Electronic-Design-Automation-EDA-84., United Kingdom (1984) [hal-00013359 - version 1]
Taking into account asynchronous signals in functional test of complex circuits
Bellon C. et al
In ACM-IEEE-21st-Design-Automation-Conference-Proceedings-84-cat.-no.-84CH2049-5. - ACM-IEEE-21st-Design-Automation-Conference-Proceedings-84-cat.-no.-84CH2049-5., United States (1984) [hal-00013356 - version 1]
Hardware and software tools for microprocessor functional test
Bellon C. et al
In International-Test-Conference-1984-Proceedings-Cat.-No.-84CH2084-2 - International-Test-Conference-1984-Proceedings-Cat.-No.-84CH2084-2, United States (1984) [hal-00013352 - version 1]