279 articles – 2093 references  [version française]
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Impact of Total Ionizing Dose on the Analog Single Event Transient Sensitivity of a Linear Bipolar Integrated Circuit
Bernard M. C. et al
IEEE Transactions on Nuclear Science 54, 6 (2007) 2534-2540 [hal-00327184 - version 1]
How to characterize the problem of SEU in processors & representative errors observed on flight
Velazco R. et al
In 11th-IEEE-International-On-Line-Testing-Symposium - 11th-IEEE-International-On-Line-Testing-Symposium, France (2005) [hal-00013331 - version 1]
Effect of Switching from High to Low Dose Rate on Linear Bipolar Technology Radiation Response
Boch J. et al
IEEE Trans. Nuclear Science 51, Issue 5, Part 3 (2004) 2896-2902 [hal-00327364 - version 1]
Hardening of a radiation sensor based on optically stimulated luminescence
Vaillé J.-R. et al
IEEE Transactions on Nuclear Science 50, 6 (2003) 2358 - 2362 [hal-00327358 - version 1]
Evidences of SEU tolerance for digital implementations of artificial neural networks: one year MPTB flight results
Velazco R. et al
Dans 1999-Fifth-European-Conference-on-Radiation-and-Its-Effects-on-Components-and-Systems.-RADECS-99 - (2000) [hal-00008222 - version 1]
Predicting error rate for microprocessor-based digital architectures through C.E.U. (Code Emulating Upsets) injection
Velazco R. et al
IEEE-Transactions-on-Nuclear-Science Dec. 2000; Volume: 47 , Issue: 6 , Part 3 (2000) 2405-2411 [hal-00008219 - version 1]
Effects of radiation on digital architectures: one year results from a satellite experiment
Velazco R. et al
Dans Proceedings.-XII-Symposium-on-Integrated-Circuits-and-Systems-Design - (1999) [hal-00008228 - version 1]
Pulsed laser validation of recovery mechanisms of critical SEEs in an artificial neural network system
Buchner S. et al
IEEE-Transactions-on-Nuclear-Science. June 1998; 45(3) pt. 3 (1998) 1501-7 [hal-00008247 - version 1]
Pulsed laser validation of recovery mechanisms of critical SEE's in an artificial neural network system
Buchner S. et al
Dans RADECS-97 - (1998) [hal-00008241 - version 1]
SEU induced errors observed in microprocessor systems
Asenek V. et al
IEEE-Transactions-on-Nuclear-Science Dec. 1998; 45(6) pt. 1 (1998) 2876-83 [hal-00008239 - version 1]
Digital fuzzy control: a robust alternative suitable for space application
Cheynet P. et al
IEEE-Transactions-on-Nuclear-Science Dec. 1998; 45(6) pt. 1 (1998) 2941-7 [hal-00008238 - version 1]
Operation in space of artificial neural networks implemented by means of a dedicated architecture based on a transputer
Velazco R. et al
Dans Proceedings.-XI-Brazilian-Symposium-on-Integrated-Circuit-Design - (1998) [hal-00008236 - version 1]
Artificial neural network robustness for on-board satellite image processing: results of upset simulations and ground tests
Velazco R. et al
IEEE-Transactions-on-Nuclear-Science. Dec. 1997; 44(6) pt. 1 (1997) 2337-44 [hal-00008248 - version 1]
Robustness against S.E.U. of an artificial neural network space application
Assoum A. et al
In RADECS-95 - (1996) [hal-00008254 - version 1]
SEU experiments on an Artificial Neural Network implemented by means of digital processors
Velazco R. et al
IEEE-Transactions-on-Nuclear-Science Dec. 1996; 43(6) pt. 1 (1996) 2889-96 [hal-00008250 - version 1]
SEU fault tolerance in artificial neural networks
Velazco R. et al
IEEE-Transactions-on-Nuclear-Science. Dec. 1995; 42(6) pt. 1 (1995) 1856-62 [hal-00008257 - version 1]