282 articles – 2128 references  [version française]
.:. Browse > List by year > 2009 .:.
151 documents ordered by :
First Previous ... 2 - 3 - 4 - 5 - 6 - 7 - 8 Next Last
Toward automated fault pruning with Petri nets
Maistri P. et al
Dans Proc. of 15th IEEE International on-line Testing Symposium (IOLTS'09), June 24-26 - 15th IEEE International on-line Testing Symposium (IOLTS'09), Portugal (2009) [hal-00419060 - version 1]
Experimental validation of a BIST technique for CMOS active pixel sensors
Lizarraga L. et al
Dans Proc. of 27th IEEE VLSI Test Symposium (VTS'09) - 27th IEEE VLSI Test Symposium (VTS'09), États-Unis (2009) [hal-00419048 - version 1]
A System Framework for the Design of Embedded Software Targeting Heterogeneous Multi-Core SoCs
Guérin X. et al
Dans Proc. of 20th IEEE International Conference on Application-specific Systems, Architectures and Processors (ASAP'09) - 20th IEEE International Conference on Application-specific Systems, Architectures and Processors (ASAP'09), États-Unis (2009) [hal-00419041 - version 1]
Synthesis of communication mechanisms for multi-tile systemsbased on heterogeneous Multi-processor System-on-Chips
Chagoya-Garzon A. et al
Dans Proc. of 20th IEEE/IFIP International Symposium on Rapid System Prototyping(RSP'09) - 20th IEEE/IFIP International Symposium on Rapid System Prototyping(RSP'09), France (2009) [hal-00419036 - version 1]
Behavioral modeling and simulation of a chemical sensor with its microelectronics front-end interface
Cenni F. et al
Dans Proc. of 3rd IEEE International Workshop on Advances in Sensors and Interfaces (IWASI'09) - 3rd IEEE International Workshop on Advances in Sensors and Interfaces (IWASI'09), Italie (2009) [hal-00418919 - version 1]
Automatic instrumentation of embedded software for high level hardware/software co-simulation
Bouchhima A. et al
Dans Proc. of Asia and South Pacific Design Automation Conference (ASP-DAC'09) - Asia and South Pacific Design Automation Conference (ASP-DAC'09), France (2009) [hal-00418912 - version 1]
Oscillation Period and Power Consumption in Configurable Self-Timed Rings Oscillators
Elissati O. et al
Dans Proc. of Joint 7th International IEEE Northeast Workshop on Circuits and Systems and TAISA ConferenceIEEE NEWCAS-TAISA Conference, Toulouse, France June 28 - July 1st - Joint 7th International IEEE Northeast Workshop on Circuits and Systems and TAISA ConferenceIEEE NEWCAS-TAISA Conference, France (2009) [hal-00418905 - version 1]
Enrichment of limited training sets in machine-learning-based analog/RF Test
Stratigopoulos H. et al
In Proc. of Design, Automation and Test in Europe Conference (DATE'09) - Design, Automation and Test in Europe Conference (DATE'09), France (2009) [hal-00418408 - version 1]
Defect filter for alternate RF test
Stratigopoulos H. et al
In Proc. of European Test Symposium (ETS'09) - European Test Symposium (ETS'09), Sevilla, Spain, May 25-29, Spain (2009) [hal-00418402 - version 1]
ACL2 for the Verification of Fault-Tolerance Properties: First Results
Pierre L. et al
Dans Proc. International Workshop on The ACL2 Theorem Prover and Its Applications - International Workshop on The ACL2 Theorem Prover and Its Applications, États-Unis (2009) [hal-00418365 - version 1]
Ensuring High Testability without Degrading Security
Di Natale G. et al
Dans European Test Symposium (ETS'09), Seville (Spain) - European Test Symposium (ETS'09), Seville (Spain), May 25-29, Espagne (2009) [hal-00418355 - version 1]
Programmable/Stoppable Oscillator Based on Self-Timed Rings
Yahya E. et al
Dans Proc. of 15th IEEE Symposium Asynchronous Circuits and Systems (ASYNC '09) - 15th IEEE Symposium on Asynchronous Circuits and Systems (ASYNC '09), États-Unis (2009) [hal-00417834 - version 1]
Electromagnetic modelling of an integrated micromachined inductive microphone
Tounsi F. et al
In Proc. of Design and Technology of Integrated Systems (DTIS'09) - Design and Technology of Integrated Systems (DTIS'09), Egypt (2009) [hal-00417689 - version 1]
High-level symbolic simulation for automatic model extraction
Ouchet F. et al
Dans Proc. IEEE Symposium on Design and Diagnostics of Electronic Systems (DDECS'09) - IEEE Symposium on Design and Diagnostics of Electronic Systems (DDECS'09), Tchèque, République (2009) [hal-00417314 - version 1]
Extending IP-XACT to support an MDE based approach for SoC design
El Mrabti A. et al
Dans Proceedings of Design Automation and Test in Europe (DATE'09) - Design Automation and Test in Europe (DATE'09), Nice, France, April 20-24, France (2009) [hal-00416580 - version 1]
Formal Verification of Communications in Networks-on-Chip
Borrione D. et al
Dans Networks-on-Chips: Theory and Practice (2009) 250p. [hal-00388401 - version 1]
MYGEN: Automata-based On-line Test Generator for Assertion-based Verification
Oddos Y. et al
Dans Proc. 19th Great Lakes Symposium on VLSI (GLSVLSI'09), - 19th Great Lakes Symposium on VLSI (GLSVLSI'09),, États-Unis (2009) [hal-00388359 - version 1]
Parameter identification of RF transceiver blocks using regressive models
Khereddine R. et al
Dans Proc. of Workshop on Programmable Devices and Embedded Systems (PDeS'09) - Workshop on Programmable Devices and Embedded Systems (PDeS'09), Czech Republic, February 10-12, Tchèque, République (2009) [hal-00386229 - version 1]
Pruning Single Event Upset Faults with Petri Nets
Maistri P.
Dans Proc. of 10th IEEE Latin-American Test Workshop (LATW'09) - 10th IEEE Latin-American Test Workshop (LATW'09), Brésil (2009) [hal-00386162 - version 1]
Efficiency of probabilistic testability analysis for soft error effect analysis: a case study
Vanhauwaert P. et al
Dans Proc. of 4th IEEE International conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS'09) - 4th IEEE International conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS'09), Égypte (2009) [hal-00386115 - version 1]