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Communications avec actes

Proceedings-International-Test-Conference-1990-Cat.-No.90CH2910-6., Washington, DC : États-Unis (1990)

Efficient UBIST implementation for microprocessor sequencing parts

M. Nicolaidis1, 2

An improved self-checking solution for the sequencing part of the MC 68000 microprocessor is presented. Compared with previous self-checking schemes for this microprocessor, the present scheme makes its possible to reduce the overhead and simplifies the implementation of both functional circuits, and checkers. The unified BIST (built-in self-test) method is applied to this scheme. This method uses a merging of self-checking and BIST techniques and allows a high fault coverage for all tests needed for integrated circuits, e.g., offline test (design verification, manufacturing, and maintenance test) and online concurrent error detection. An area overhead of about 27% is required, which is quite satisfactory in comparison with previous results.

1 :	IROC TECHNOLOGIES - iROc Technologies
2 :	TIMA - Techniques of Informatics and Microelectronics for integrated systems Architecture

Mots Clés : logic-testing – production-testing – mentation-for-microprocessor-sequencing – self-checking – MC-68000-microprocessor – functional-circuits – unified-BIST – fault-coverage – integrated-circuits – offline-test – design-verification – maintenance-test – online-concurrent-error-detection – area-overhead

hal-00014037, version 1

http://hal.archives-ouvertes.fr/hal-00014037

oai:hal.archives-ouvertes.fr:hal-00014037

Contributeur : Lucie Torella <>

Soumis le : Jeudi 17 Novembre 2005, 11:33:07

Dernière modification le : Jeudi 23 Février 2006, 16:24:05