279 articles – 2094 Notices  [english version]
Fiche détaillée Communications avec actes
Proceedings-of-Automatic-Testing-and-Test-Instrumentation-'84, Paris : France (1984)
Advances in test pattern generation for integrated circuits
B. Courtois1

Testing is becoming a challenge, due to the increase of circuit integration. The author presents a classification according to the life-cycle of integrated circuits and a classification of test pattern generation methods. Advances in structural testing and functional testing are considered. Electron beam testing and design for testability are also described.
1 :  TIMA - Techniques of Informatics and Microelectronics for integrated systems Architecture
electron-beam-testing – IC-testing – automatic-testing – test-pattern-generation – integrated-circuits – classification- – life-cycle