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Articles dans des revues avec comité de lecture

Microelectronic-Engineering May 1990; 12(1-4) (1990) 113-120

Top down IC failure analysis using an E-beam system coupled to a functional teste

R. Velazco1, D. Conard1, A. Guyot1, H. Ziade2

A diagnosis system devoted to precise failure analysis of complex ICs has been built up by coupling an E-beam tester, a functional tester and a test program generator. A case study illustrates the approach efficiency and the tools flexibility.

1 :	TIMA - Techniques of Informatics and Microelectronics for integrated systems Architecture
2 :	FACULTY OF ENGINEERING I - Faculty of Engineering I

Mots Clés : top-down-IC-failure-analysis – electron-beam-tester – functional-tester – diagnosis-system – test-program-generator

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Contributeur : Lucie Torella <>

Soumis le : Lundi 29 Août 2005, 12:21:54

Dernière modification le : Lundi 29 Août 2005, 12:21:54